Precession Electron Diffraction assisted Orientation Mapping in the Transmission Electron Microscope
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TLDR
Precession electron diffraction (PED) as mentioned in this paper is a new promising technique for X-ray diffraction pattern collection under quasi-kinematical conditions, which enables "ab-initio" solving of crystalline structures of nanocrystals.Abstract:
Precession electron diffraction (PED) is a new promising technique for electron diffraction pattern collection under quasi-kinematical conditions (as in X-ray Diffraction), which enables "ab-initio" solving of crystalline structures of nanocrystals. The PED technique may be used in TEM instruments of voltages 100 to 400 kV and is an effective upgrade of the TEM instrument to a true electron diffractometer. The PED technique, when combined with fast electron diffraction acquisition and pattern matching software techniques, may also be used for the high magnification ultra-fast mapping of variable crystal orientations and phases, similarly to what is achieved with the Electron Backscattered Diffraction (EBSD) technique in Scanning Electron Microscopes (SEM) at lower magnifications and longer acquisition times.read more
Citations
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Journal ArticleDOI
Automated crystal orientation and phase mapping in TEM
Edgar F. Rauch,Muriel Véron +1 more
TL;DR: In this paper, an automated crystal orientation and phase mapping technique that allows nanoscale characterization of crystalline materials with a transmission electron microscope is described, and the template matching strategy used to identify the diffraction patterns is detailed and the resulting outputs of the technique are illustrated.
Journal ArticleDOI
High spatial resolution semi-automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes
Peter Moeck,Sergei Rouvimov,Edgar F. Rauch,Muriel Véron,Holm Kirmse,Ines Häusler,Wolfgang Neumann,Daniel Bultreys,Y. Maniette,Stavros Nicolopoulos +9 more
TL;DR: In this paper, a semi-automatic technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope (TEM) is described, based primarily on the projected reciprocal lattice geometry, but also utilizes the intensity of reflections that are extracted from precessionenhanced electron diffraction spot patterns of polycrystalline materials and multi-material composites.
Journal ArticleDOI
Fast electron diffraction tomography
Mauro Gemmi,Mari Grazia Immacolata La Placa,Athanassios S. Galanis,Edgar F. Rauch,Stavros Nicolopoulos +4 more
TL;DR: In this article, a fast and fully automatic procedure for collecting electron diffraction tomography data is presented, in which the missing wedge of the reciprocal space between the patterns is recorded by longer exposures during the crystal tilt, and automatic data collection of limited tilt range can be used to determine the unitcell parameters, while data of larger tilt range are suitable to solve the crystal structure ab initio with direct methods.
Journal ArticleDOI
Decoding crystallography from high-resolution electron imaging and diffraction datasets with deep learning
Jeffery A. Aguiar,Matthew L. Gong,Matthew L. Gong,Raymond R. Unocic,Tolga Tasdizen,Brandon D. Miller +5 more
TL;DR: A convolutional neural network model was developed for reliable classification of crystal structures from small numbers of electron images and diffraction patterns with no preferred orientation and it narrows down the space groups to the top two with over 70% confidence in the worst case and up to 95% in the common cases.
Journal ArticleDOI
In situ transmission electron microscopy of crystal growth-mode transitions during rapid solidification of a hypoeutectic Al–Cu alloy
Joseph T. McKeown,Andreas Kulovits,Can Liu,Kai Zweiacker,Bryan W. Reed,Thomas LaGrange,Jörg M.K. Wiezorek,Geoffrey H. Campbell +7 more
TL;DR: In this article, a pulsed-laser-melted hypoeutectic Al-Cu thin-film alloy was monitored using in situ transmission electron microscopy with high spatial and temporal resolutions.
References
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Reference BookDOI
Introduction to texture analysis : macrotexture, microtexture and orientation mapping
Valerie Randle,Olaf Engler +1 more
TL;DR: A Guide to the Book Descriptors of Orientation Crystal Structures and Crystal Symmetries Transformation between Coordinate Systems: The Rotation matrix The "Ideal Orientation" (Miller or Miller-Bravais Indices) Notation The Reference Sphere, Pole Figure, and Inverse Pole Figure The Euler Angles and Euler Space The angle/axis of Rotation and Cylindrical Angle/Axis of Rosters Space The Rodrigues Vector and Rodrigues Space Application of Diffraction to Texture Analysis Diffraction of Radiation and Bragg's
Automatic Crystal Orientation and Phase Mapping in TEM by Precession Diffraction
Edgar F. Rauch,Edgar F. Rauch,Muriel Véron,J. Portillo,Daniel Bultreys,Y. Maniette,Stavros Nicolopoulos +6 more
TL;DR: In this article, a new automated crystal orientation and phase mapping tool is described, which combines a diffraction pattern acquisition system involving a CCD camera with pattern identification software that makes use of fast template-matching algorithms.
Coupled microstructural observations and local texture measurements with an automated crystallographic orientation mapping tool attached to a Tem
Edgar F. Rauch,Muriel Véron +1 more
TL;DR: In this article, an automated crystal orientation mapping tool attached to a transmission electron microscope is described, where electron beam displacement is controlled by a remote computer while thousands of diffraction patterns are recorded with an external CCD camera and analyzed with a dedicated software.
Journal ArticleDOI
Coupled microstructural observations and local texture measurements with an automated crystallographic orientation mapping tool attached to a tem
Edgar F. Rauch,Muriel Véron +1 more
TL;DR: In this article, an automated crystal orientation mapping tool attached to a transmission electron microscope is described, where electron beam displacement is controlled by a remote computer while thousands of diffraction patterns are recorded with an external CCD camera and analyzed with a dedicated software.
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