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Primary electron energy dependent flashover in surface polarity on Au films

TLDR
In this article, the primary electron energy (Ep) dependent change in target current was studied on a grounded Au film in the range of 40 to 3500 eV and the current jumped suddenly from a negative to a positive value at ∼650 eV with increasing Ep, while it disappeared in reverse sweep and with increasing substrate temperature.
Abstract
Primary electron energy (Ep) dependent change in target current was studied on a grounded Au film in the range of 40 to 3500 eV. The current jumped suddenly from a negative to a positive value at ∼650 eV with increasing Ep, while it disappeared in reverse sweep and with increasing substrate temperature. Detailed analysis suggests that Ep dependent surface charging plays a pivotal role in flashover. Prior to critical Ep in the forward sweep, a gradual shift of a double peak-like structure towards high kinetic energy region in the secondary electron spectra also confirms surface charging effect.

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Citations
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Heating-induced variations of secondary electron emission from ion-cleaned copper samples.

TL;DR: Measurements in situ in a multifunctional ultrahigh vacuum system provide a new insight into complicated surface influences on SE emission in thermal applications of scanning electron microscopy.

Radiation Induced Surface Modification and Contamination for EUV Lithography and Fusion Applications

A. Al-Ajlony
TL;DR: Al-Montaser Bellah Al-Ajlony et al. as mentioned in this paper have discussed the effect of ionizing radiation on materials surfaces and the importance of this topic rises from the severity of the implications that a surface at a certain application might suffer due its interaction with some sort of ionising radiation.
References
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Journal ArticleDOI

Some considerations on the electric field induced in insulators by electron bombardment

TL;DR: In this paper, a simple model of the distributions of charge created in an insulator by bombardment with electrons, the components of the electric field are evaluated by using Maxwell's equations and image effects, applied to the most common experimental situations: a semi-infinite sample (i) bounded by a vacuum or (ii) covered by a conducting film, and a sample in the form of a film (iii) unsupported or (iv) covering a conducting substrate.
Journal ArticleDOI

A new examination of secondary electron yield data

TL;DR: In this article, a new and thorough examination of secondary electron (SE) yield as a function of primary energy (EPE) and atomic number Z for the 44 elements in the database is made.
Journal ArticleDOI

Charging and flashover induced by surface polarization relaxation process

TL;DR: In this article, the authors described electric charges trapping into a dielectric medium from polarons trapped into sites which are characteristic of the material structure (polaron trap) in terms of susceptibility.
Journal ArticleDOI

Transmission, energy distribution, and SE excitation of fast electrons in thin solid films

TL;DR: In this paper, the transmission and backscattering of electrons with energies between 0.5 and 4 keV in thin films of Be, Al, Ge, Cu, and Ag, together with their secondary yields (δT, δR), were measured with a threecollector system.
Journal ArticleDOI

Electron trapping in amorphous SiO2 studied by charge buildup under electron bombardment

TL;DR: In this paper, the role of electronic excitation to produce defects in silica is discussed, and the influence of temperature on amorphous and monocrystalline SiO2 is studied.
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