Journal•ISSN: 0968-4328
Micron
Elsevier BV
About: Micron is an academic journal published by Elsevier BV. The journal publishes majorly in the area(s): Scanning electron microscope & Transmission electron microscopy. It has an ISSN identifier of 0968-4328. Over the lifetime, 3614 publications have been published receiving 79477 citations.
Topics: Scanning electron microscope, Transmission electron microscopy, Scanning transmission electron microscopy, High-resolution transmission electron microscopy, Microscopy
Papers published on a yearly basis
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TL;DR: In the light of recent experimental evidence, two common assumptions are re-examine: that the amount of radiation damage is proportional to the electron dose and is independent of beam diameter; and that the extent of the damage is proportionate to theamount of energy deposited in the specimen.
1,756 citations
TL;DR: The use of focused ion beam (FIB) milling for the preparation of transmission electron microscopy (TEM) specimens is described in this article, where the operation of the FIB instrument is discussed and the conventional and lift-out techniques for TEM specimen preparation and the advantages and disadvantages of each technique are detailed.
1,078 citations
TL;DR: This entry is aimed to review the recent AFM applications for the study of dynamics and mechanical properties of intact cells associated with different cell events such as locomotion, differentiation and aging, physiological activation and electromotility, as well as cell pathology.
742 citations
TL;DR: There is strong evidence for their widespread distribution in prokaryotes and the first crystal structure of a bacterial laccase is already available, indicating their high non-specific oxidation capacity.
629 citations
TL;DR: The CTM4XAS program for the analysis of transition metal L edge Electron Energy Loss Spectroscopy (EELS) or X-ray Absorption Spectra (XAS) is explained and a number of examples are presented.
588 citations