According to government officials, automakers, and academics, vehicular ad hoc networks (VANET) may be an effective tool for improving safety and efficiency on the road. For safety-related information to be disseminated, VANET uses cars and infrastructure nodes to interact with each other. Over the years, interest in vehicular communications has developed and is now acknowledged as a pillar of the intelligent transportation systems (ITSs). Nodes in vehicular networks have a lot of electricity and computational power (storage and processing) as a requirement. Electrification and renewable energy initiatives are relocating workforces. Controlling and regulating power flow from several sources and converters to various vehicle loads is critical in electric vehicle technology (EVT) and VANET. In this chapter, the authors put forward an extensive study over the power controllers and the use of artificial intelligence and machine learning in this field. Neural network systems for power optimization are explored. Intelligent power management systems developed are also a part of the focus. 

Probing Mechanics at the Extremes

Artificial Intelligence-Based Approaches in Vehicular Power Energy Application

Chapter 1: Stresses and Strains Chapter 2: Foundations of Plasticity Chapter 3: Elasto-Plastic Bending and Torsion Chapter 4: Plastic Analysis of Beams and Frames Chapter 5: Further Solutions of Elasto-Plastic Problems Chapter 6: Theory of the Slipline Field Chapter 7: Steady Problems in Plane Strain Chapter 8: Non-Steady Problems in Plane Strain

Theory of elasticity

1. Properties of X-rays. 2. Geometry of Crystals. 3. Diffraction I: Directions of Diffracted Beams. 4. Diffraction II: Intensities of Diffracted Beams. 5. Diffraction III: Non-Ideal Samples. 6. Laure Photographs. 7. Powder Photographs. 8. Diffractometer and Spectrometer. 9. Orientation and Quality of Single Crystals. 10. Structure of Polycrystalline Aggregates. 11. Determination of Crystal Structure. 12. Precise Parameter Measurements. 13. Phase-Diagram Determination. 14. Order-Disorder Transformation. 15. Chemical Analysis of X-ray Diffraction. 16. Chemical Analysis by X-ray Spectrometry. 17. Measurements of Residual Stress. 18. Polymers. 19. Small Angle Scatters. 20. Transmission Electron Microscope.

Elements of X-ray diffraction

The mechanical properties of thin films on substrates are described and studied. It is shown that very large stresses may be present in the thin films that comprise integrated circuits and magnetic disks and that these stresses can cause deformation and fracture to occur. It is argued that the approaches that have proven useful in the study of bulk structural materials can be used to understand the mechanical behavior of thin film materials. Understanding the mechanical properties of thin films on substrates requires an understanding of the stresses in thin film structures as well as a knowledge of the mechanisms by which thin films deform. The fundamentals of these processes are reviewed. For a crystalline film on a nondeformable substrate, a key problem involves the movement of dislocations in the film. An analysis of this problem provides insight into both the formation of misfit dislocations in epitaxial thin films and the high strengths of thin metal films on substrates. It is demonstrated that the kinetics of dislocation motion at high temperatures are expecially important to the understanding of the formation of misfit dislocations in heteroepitaxial structures. The experimental study of mechanical properties of thin films requires the development and use of nontraditional mechanical testing techniques. Some of the techniques that have been developed recently are described. The measurement of substrate curvature by laser scanning is shown to be an effective way of measuring the biaxial stresses in thin films and studying the biaxial deformation properties at elevated temperatures. Submicron indentation testing techniques, which make use of the Nanoindenter, are also reviewed. The mechanical properties that can be studied using this instrument are described, including hardness, elastic modulus, and time-dependent deformation properties. Finally, a new testing technique involving the deflection of microbeam samples of thin film materials made by integrated circuit manufacturing methods is described. It is shown that both elastic and plastic properties of thin film materials can be measured using this technique.

Mechanical properties of thin films

When a crystal deforms plastically, phenomena such as dislocation storage, multiplication, motion, pinning, and nucleation occur over the submicron-to-nanometer scale. Here we report measurements of plastic yielding for single crystals of micrometer-sized dimensions for three different types of metals. We find that within the tests, the overall sample dimensions artificially limit the length scales available for plastic processes. The results show dramatic size effects at surprisingly large sample dimensions. These results emphasize that at the micrometer scale, one must define both the external geometry and internal structure to characterize the strength of a material.

http://science.sciencemag.org/content/sci/305/5686/986.full.pdf

Probing Mechanics at the Extremes

Citations

Artificial Intelligence-Based Approaches in Vehicular Power Energy Application

References

Theory of elasticity

Elements of X-ray diffraction

Mechanical properties of thin films

Sample dimensions influence strength and crystal plasticity.

Some geometrical relations in dislocated crystals

Related Papers (1)

Building and Probing Small for Mechanics