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Resolution deterioration in emission electron microscopy due to object roughness

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TLDR
In this article, a general analytic expression has been obtained and confirmed by a computer simulation which links the surface roughness of an object under study in an emission electron microscope and it's resolution.
Abstract
In the present paper a general analytic expression has been obtained and confirmed by a computer simulation which links the surface roughness of an object under study in an emission electron microscope and it's resolution A quantitative derivation was made for the model case when there is a step on the object surface It was shown that the resolution is deteriorated asymmetrically relative to the step The effect sets a practical limit to the ultimate lateral resolution obtainable in an emission electron microscope

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Journal ArticleDOI

Investigating surface magnetism by means of photoexcitation electron emission microscopy

TL;DR: In this paper, the authors demonstrate the unique potential and the versatility of the PEEM approach, and review the current status with a certain emphasis on experiments with soft x-ray excitation.
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Phase propagation of localized surface plasmons probed by time-resolved photoemission electron microscopy

TL;DR: In this article, the authors demonstrate that the sampling of the LSP dynamics by means of time-resolved PEEM enables detailed insight into the propagation processes associated with these excitations, and observe spatio-temporal modulations in the photoemission yield from a single nanoparticle.
Journal ArticleDOI

The complex dispersion relation of surface plasmon polaritons at gold/para-hexaphenylene interfaces

TL;DR: In this article, a 2P-PEEM study on the dispersion relation of dielectric-loaded gold surfaces shows how effective the propagation of surface plasmon polaritons at a gold/para-hexaphenylene interface can be tuned by adjustment of the film thickness.
Journal ArticleDOI

Wave optical treatment of surface step contrast in low-energy electron microscopy

TL;DR: In this paper, a wave optical treatment of surface step contrast in a low-energy electron microscopy (LEEM) imaging system is presented, where the aberrations of an idealised LEEM imaging system are directly incorporated into a transfer function (TF) and image simulations of surface steps are evaluated in one and two dimensions.
Journal ArticleDOI

Imaging surface topography using Lloyd's mirror in photoemission electron microscopy.

TL;DR: Lloyd's mirror is used to modulate electron photoemission inphotoemission electron microscopy, which results in the projection of Lloyd's fringes on to three-dimensional (3D) surface objects and it is possible to extract 3D height information directly from a two-dimensional, plan-view image.
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