Journal ArticleDOI
Techniques of convergent beam electron diffraction
TLDR
The techniques required to record standard convergent beam electron diffraction patterns in an analytical electron microscope are discussed in detail, with emphasis on the design of electron optics in commercial instruments.Abstract:
The techniques required to record standard convergent beam electron diffraction patterns in an analytical electron microscope are discussed in detail, with emphasis on the design of electron optics in commercial instruments. Practical comments are included on specimen preparation, the influence of crystal defects, tilting to major zone axes, and alignment of the instrument. The influence of parameters under experimental control such as probe size, accelerating voltage, temperature, specimen thickness, and convergence angle is discussed in detail. Some comments are included on the alignment and limitations of large angle patterns formed by a defocused probe.read more
Citations
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Journal ArticleDOI
Position averaged convergent beam electron diffraction: Theory and applications
TL;DR: It is demonstrated that the absorptive model is appropriate for measuring thickness and other specimen parameters even for relatively thick samples (>50nm).
Book ChapterDOI
Convergent Beam Electron Diffraction
TL;DR: In this article, the authors proposed a method to eliminate the variation in the illumination of the illuminated volume of an electron diffraction image by using a convergent beam electron microscopy (CBD) technique.
Book ChapterDOI
Instrumentation and Experimental Techniques
Jian-Min Zuo,John C. H. Spence +1 more
TL;DR: In this article, the authors outline the general features which are desirable in an electron microscope intended for microdiffraction work, and present a series of compromise designs, from which a tilt range and minimum probe size combination can be selected.
Journal ArticleDOI
Effects of energy filtering in LACBED patterns
TL;DR: In this paper, the EELS spectrum from 250 keV large-angle convergent beam electron diffraction (LACBED) patterns of InP, using either 2 or 5 μm selected-area diffraction apertures, are recorded as a function of vertical displacement Δ z of the specimen from the eucentric height.
Journal ArticleDOI
Surface relaxation of strained heterostructures revealed by Bragg line splitting in LACBED patterns
TL;DR: In this article, Bragg line splitting near the shadow image of a thin strained InGaAs layer, buried in GaAs and without strain relief by misfit dislocations, was found in large angle convergent beam electron diffraction (LACBED) patterns of cross-section specimens.
References
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Book ChapterDOI
Convergent Beam Electron Diffraction
TL;DR: In this article, the authors proposed a method to eliminate the variation in the illumination of the illuminated volume of an electron diffraction image by using a convergent beam electron microscopy (CBD) technique.
Journal ArticleDOI
Large-Angle Convergent-Beam Electron Diffraction
Journal ArticleDOI
Space‐group determination by dynamic extinction in convergent‐beam electron diffraction
M. Tanaka,H. Sekii,T. Nagasawa +2 more
TL;DR: In this article, a table of dynamic extinction lines which occur in convergent-beam electron diffraction patterns (GM lines) is given for all the space groups on the basis of the rules given by Gjonnes & Moodie [Acta Cryst. (1965), 19, 65-67].
Journal ArticleDOI
Use of high-symmetry zone axes in electron diffraction in determining crystal point and space groups
J.W. Steeds,R. Vincent +1 more
TL;DR: In this article, a sequence of steps for making use of the information available on convergent-beam electron diffraction patterns from high-symmetry zone axes for crystal point and space-group determination is given.
Journal ArticleDOI
Real Space Crystallography in Molybdenite
TL;DR: Real Space Crystallography as mentioned in this paper uses bend contour patterns, which are produced in thin domed or saucer-shaped foil specimens when an aperture is inserted in the back focal plane of the objective lens of an electron microscope.
Related Papers (5)
Convergent beam diffraction studies of interfaces, defects, and multilayers.
D. Cherns,A. R. Preston +1 more