Journal ArticleDOI
Position averaged convergent beam electron diffraction: Theory and applications
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It is demonstrated that the absorptive model is appropriate for measuring thickness and other specimen parameters even for relatively thick samples (>50nm).About:
This article is published in Ultramicroscopy.The article was published on 2010-01-01. It has received 197 citations till now. The article focuses on the topics: Reflection high-energy electron diffraction & Electron diffraction.read more
Citations
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Journal ArticleDOI
Giant piezoelectricity of Sm-doped Pb(Mg1/3Nb2/3)O3-PbTiO3 single crystals.
Fei Li,Fei Li,Matthew J. Cabral,Bin Xu,Bin Xu,Zhenxiang Cheng,Elizabeth C. Dickey,James M. LeBeau,Jianli Wang,Jun Luo,Samuel Taylor,Wesley S. Hackenberger,Laurent Bellaiche,Zhuo Xu,Long Qing Chen,Thomas R. Shrout,Shujun Zhang,Shujun Zhang +17 more
TL;DR: Rare-earth doping is identified as a general strategy for introducing local structural heterogeneity in order to enhance the piezoelectricity of relaxor ferroelectric crystals.
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On the structural origins of ferroelectricity in HfO2 thin films
TL;DR: In this article, a structural study on the origin of ferroelectricity in Gd doped HfO2 thin films is presented, which provides unambiguous evidence for the existence of a non-centrosymmetric orthorhombic phase that can support spontaneous polarization.
Journal ArticleDOI
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond.
TL;DR: The use of these four-dimensional STEM experiments for virtual diffraction imaging, phase, orientation and strain mapping, measurements of medium-range order, thickness and tilt of samples, and phase contrast imaging methods, including differential phase contrast, ptychography, and others are reviewed.
Journal ArticleDOI
Phase contrast STEM for thin samples: Integrated differential phase contrast.
TL;DR: The theory is validated with simulations and the first experimental results of the iDPC-STEM technique are presented showing its capability for imaging both light and heavy elements with atomic resolution and a good signal to noise ratio (SNR).
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Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts
Andrew B. Yankovich,Benjamin Berkels,Wolfgang Dahmen,Peter Binev,Sergio I. Sanchez,Steven A. Bradley,Ao Li,Izabela Szlufarska,Paul M. Voyles +8 more
TL;DR: Sub-picometre precision and standardless atom counting with <1 atom uncertainty in the same scanning transmission electron microscopy image provide new insight into the three-dimensional atomic structure of catalyst nanoparticle surfaces, which contain the active sites controlling catalytic reactions.
References
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Book
Electron Energy-Loss Spectroscopy in the Electron Microscope
Ray F. Egerton,Dale E. Newbury +1 more
TL;DR: In this article, the authors present an overview of the basic principles of energy-loss spectroscopy, including the use of the Wien filter, and the analysis of the inner-shell of the detector.
Book
Advanced computing in electron microscopy
TL;DR: The Transmission Electron Microscope helps in the calculation of images of Thin and Thick Specimens using the Fourier Projection Theorem and the Bilinear Interpolation.
Journal ArticleDOI
EELS Log-Ratio Technique for Specimen-Thickness Measurement in the TEM
TL;DR: This paper discusses measurement of the local thickness t of a transmission microscope specimen from the log-ratio formula t = lambda ln (It/I0) where It and I0 are the total and zero-loss areas under the electron-energy loss spectrum.
Journal ArticleDOI
The determination of foil thickness by scanning transmission electron microscopy
TL;DR: In this article, a simple and accurate method of determining foil thickness is described, which makes use of measurements of the spacing of intensity oscillations in convergent beam diffraction patterns obtained with commercial scanning transmission electron microscopes.
Journal ArticleDOI
Direct observation of d-orbital holes and Cu–Cu bonding in Cu2O
TL;DR: In this paper, the authors used convergent-beam electron diffraction combined with X-ray diffraction to map the charge-density distribution in the simple oxide Cu2O, which then compare with electronic-structure calculations.