Journal ArticleDOI
The measurement of atomic number and composition in an SEM using backscattered detectors
M. D. Ball,D. G. McCartney +1 more
TLDR
In this paper, the atomic number dependence of electron backscattering can be used as the basis of a microanalysis technique and the operating procedures and condition for quantitative measurements of specimen atomic number are outlined and an expression relating the accuracy of composition to atomic number sensitivity has been derived.Abstract:
SUMMARY
The atomic number dependence of electron backscattering can be used as the basis of a microanalysis technique. The operating procedures and condition for quantitative measurements of specimen atomic number are outlined and an expression relating the accuracy of composition to the atomic number sensitivity has been derived. Some measurements of the spatial resolution of backscattered electron microanalysis are also presented and compared with the resolution of X-ray microanalysis.
Although the range of application of this technique is limited, where it can be applied it has the following advantages: (i) higher spatial resolution than X-ray microanalysis for bulk specimens; (ii) very rapid measurement; (iii) can be applied to compounds of low atomic number elements, (e.g. borides, carbides, nitrides, etc.); (iv) specimen preparation is often relatively straightforward.read more
Citations
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Journal ArticleDOI
Low voltage scanning electron microscopy.
TL;DR: The advantages of low voltage operation, recent progress in instrumentation and a prototype instrument designed and built for optimum performance at 1 kV are described, which substantially removes the practical deterrents to operation in this mode.
Journal ArticleDOI
Microstructure formation and corrosion behaviour in HVOF-sprayed Inconel 625 coatings
TL;DR: In this article, the nickel-based alloy Inconel 625 was thermally sprayed by two different variants of the high velocity oxy-fuel process and microstructural evolution of the coatings, using scanning electron microscopy and X-ray diffraction, were presented along with results on their aqueous corrosion behaviour, obtained from salt spray and potentiodynamic tests.
Book ChapterDOI
Diffusion in Metals and Alloys
Zoltán Balogh,Guido Schmitz +1 more
TL;DR: In this article, it was shown that diffusion in solid materials can reach a rate of about a micrometer per second and this rate drops down to about a nanometer per second at half the melting temperature.
Journal ArticleDOI
Application of backscattered electron microscopy in shale petrology
TL;DR: In this article, a grey pyritic mudstone from Central Wales (Red Vein unit of the Dicellograptus anceps zone, Upper Ordovician Ashgill) has been examined in thin section by scanning electron microscopy using backscattered electrons.
Book ChapterDOI
LVSEM for High Resolution Topographic and Density Contrast Imaging
TL;DR: The most recent generation of low-voltage scanning electron microscopes yields resolutions well below one nanometer thanks to the use of field-emission guns as discussed by the authors, and the authors in this paper discuss some of the contrast mechanisms that contribute to the image in these instruments.
References
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Book
Quantitative electron-probe microanalysis
V. D. Scott,G. Love +1 more
TL;DR: The development of Electroprobe Microanalysis - An Historical Perspective as discussed by the authors The Physical Basis of Quantitative Analysis The development of electroprobe microanalysis is described in detail in Section 2.1.
Journal ArticleDOI
Backscattering of Kilovolt Electrons from Solids
TL;DR: In this paper, the total number and energy distribution of backscattered electrons at 0.2-4 kev incident energy were measured for six elements using electrostatic retarding potential techniques.
Journal ArticleDOI
The structures expected in a simple ternary eutectic system: Part 1. Theory
TL;DR: In this paper, the structural regions of a two component system may be explained using a stability analysis and a competitive growth criterion, and it is suggested that these ideas may be extended to a three component system.
Journal ArticleDOI
Physical background of electron backscattering
TL;DR: In this paper, the parameters governing electron backscattering from thin films and from bulk solids are reviewed: atomic scattering cross-section, atomic number, single/multiple scattering, film thickness, scattering angular distribution, angle of incidence, diffraction effects.
Journal ArticleDOI
The structures expected in a simple ternary eutectic system: Part II. The Al-Ag-Cu ternary system
TL;DR: In this article, the ternary eutectic structure between α-Al, Ag2Al, and CuAl2 was investigated for several different growth rates, ranging from 6.4 × 10−1 mm·S−1 to 5.6 × 10 −3 mm· s−1.