Open Access
X-RAY TOPOGRAPHY CONTRAST OF EDGE DISLOCATIONS IN ZnGeP2 SINGLE CRYSTALS
Reads0
Chats0
TLDR
In this paper, contrast rosettes of edge dsocatons of the X-ray topography are depicted in the form of Contrast Rosettes, which are used to measure contrast.Abstract:
при различных условиях дифракции. Проведено моделирование изображений краевых дислокаций в условиях эффекта Бормана для случаев, когда вектор дифракции параллелен и перпендикулярен плоскости скольжения дислокации. Обсуждаются механизмы формирования дислокационного контраста. Ключевые слова: рентгеновская топография, эффект Бормана, контраст, монокристалл, полупроводник, дефект, дислокация, моделирование X-ray topography mages ni the form of contrast rosettes of edge dsocatons of theread more
Citations
More filters
Journal ArticleDOI
Low-angle boundaries in ZnGeP2 single crystals
TL;DR: In this paper, the structure of low-angle boundaries in ZnGeP2 crystals grown by the vertical Bridgman technique was studied using Borrmann X-ray topography.
Journal ArticleDOI
Photoelasticy method for study of structural imperfection of ZnGeP 2 crystals
TL;DR: In this article, photoelastic topography of ZnGeP2 has been compared with X-Ray topography based on Borrmann method and it was shown that the strongest contrast is observed on boundaries of dislocation rows and regions of relatively perfect crystals.
Journal ArticleDOI
Ray Tracing Simulation of Images of Dislocations and Inclusions on X-Ray Topographs of GaAs Epitaxial Wafers
TL;DR: In this paper, a ray tracing simulation of expected dislocations in (AlxGa(1-x))0.5In 0.5P epitaxial layers on GaAs substrates has been carried out by using well-known expressions for displacement fields around dislocation.
Journal ArticleDOI
X-Ray Diffraction Topography Methods (Review)
TL;DR: In this article, various X-ray topography methods for visualizing crystal lattice defects are described, issues of the formation of diffraction contrast are considered, and examples of the use of Xray topographical topography for studying various structural defects of the lattice are given.
Journal ArticleDOI
Structural defects in ZnGeP2 single crystals revealed by X-ray topography
TL;DR: In this article, the results of X-ray transmission topography and diffraction analysis of a ZnGeP2 single crystal grown by the vertical Bridgman method in the [001] direction are presented and discussed.
References
More filters
Book
Theory of Dislocations
John Price Hirth,Jens Lothe +1 more
TL;DR: Dislocations in Isotropic Continua: Effects of Crystal Structure on Dislocations and Dislocation-Point-Defect Interactions at Finite temperatures.
Book
Dynamical theory of x-ray diffraction
TL;DR: In this paper, the dynamical theory of diffraction of X-rays by perfect crystals is presented and the expressions for the diffracted intensity are given in both the transmission and reflection cases.
Journal ArticleDOI
The displacement and stress fields of a general dislocation close to a free surface of an isotropic solid
S. J. Shaibani,P. M. Hazzledine +1 more
TL;DR: In this paper, the displacement and stress fields of a dislocation with any Burgers vector which meets the surface of a semi-infinite isotropic solid at any angle are given in an explicit form.
Journal ArticleDOI
Infrared absorption bands associated with native defects in ZnGeP2
Nancy C. Giles,Lihua Bai,M. M. Chirila,N. Y. Garces,K. T. Stevens,Peter G. Schunemann,Scott D. Setzler,Thomas M. Pollak +7 more
TL;DR: In this paper, three broad absorption bands in the spectral range from 1 to 4 μm that are due to native defects were identified, and the strength of these two bands can be increased or decreased by illuminating the crystal with selected laser wavelengths.
Related Papers (5)
X-ray topography contrast from edge dislocations in ZnGeP2 single crystals
A.O. Okunev,G. A. Verozubova +1 more
Detection of dislocations in strongly absorbing crystals by projection x-ray topography in back reflection
I L Shul'pina,T. S. Argunova +1 more