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An-Ping Li
Researcher at Oak Ridge National Laboratory
Publications - 160
Citations - 7785
An-Ping Li is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Scanning tunneling microscope & Graphene nanoribbons. The author has an hindex of 35, co-authored 146 publications receiving 6849 citations. Previous affiliations of An-Ping Li include Max Planck Society & University of Lyon.
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High aspect ratio microstructures based on anisotropic porous materials
Frank Müller,A. Birner,Jörg Schilling,An-Ping Li,Kornelius Nielsch,Ulrich Gösele,Volker Dr. Lehmann +6 more
TL;DR: In this paper, the authors demonstrate the power of this technique for macroporous silicon and porous anodic alumina structures with sub-micrometer precision and aspect ratios above 100.
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Control of long-distance motion of single molecules on a surface.
Donato Civita,Marek Kolmer,Grant J. Simpson,An-Ping Li,Stefan Hecht,Stefan Hecht,Stefan Hecht,Leonhard Grill +7 more
TL;DR: At cryogenic temperatures, the bias voltage from an STM tip can propel a large organic molecule, dibromoterfluorene, long distances—tens of nanometers along straight tracks on the flat silver surface (see the Perspective by Esch and Lechner).
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Nanomanipulation and nanofabrication with multi-probe scanning tunneling microscope: from individual atoms to nanowires
TL;DR: A bottom-up technique for nanomanipulation and nanofabrication is reported by using a 4-probe scanning tunneling microscope (STM) combined with a scanning electron microscope (SEM), expected to be a valuable tool for rapid prototyping in the nanoscience and nanotechnology.
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High-throughput electrical measurement and microfluidic sorting of semiconductor nanowires
Cevat Akin,Leonard C. Feldman,Corentin Durand,Saban M. Hus,An-Ping Li,Ho Yee Hui,Michael A. Filler,Jingang Yi,Jerry W. Shan +8 more
TL;DR: A high-throughput, solution-based electro-orientation-spectroscopy (EOS) method, capable of automated electrical characterization of individual nanowires by direct optical visualization of their alignment behavior under spatially uniform electric fields of different frequencies, is demonstrated.