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Andreas Stoffers
Researcher at Max Planck Society
Publications - 10
Citations - 414
Andreas Stoffers is an academic researcher from Max Planck Society. The author has contributed to research in topics: Grain boundary & Silicon. The author has an hindex of 6, co-authored 9 publications receiving 304 citations. Previous affiliations of Andreas Stoffers include RWTH Aachen University.
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Journal ArticleDOI
Simultaneous optimization of electrical and thermal transport properties of Bi0.5Sb1.5Te3 thermoelectric alloy by twin boundary engineering
Yuan Yu,Yuan Yu,Dongsheng He,Siyuan Zhang,Oana Cojocaru-Mirédin,Torsten Schwarz,Torsten Schwarz,Andreas Stoffers,Xiao-yu Wang,Shuqi Zheng,Bin Zhu,Christina Scheu,Di Wu,Jiaqing He,Matthias Wuttig,Zhong-Yue Huang,Fang-Qiu Zu +16 more
TL;DR: In this article, a liquid state manipulation method for solidified Bi 0.5 Sb 1.5 Te 3 alloy with subsequent melt spinning, ball milling, and spark plasma sintering processes is combined to construct dedicated microstructures containing plenty of 60° twin boundaries.
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Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography
Andreas Stoffers,Oana Cojocaru-Mirédin,Winfried Seifert,Stefan Zaefferer,Stephan Riepe,Dierk Raabe +5 more
TL;DR: In this paper, the influence of crystallographic structure and impurity decoration on the recombination activity at grain boundaries in multicrystalline silicon ingots has been investigated and a direct correlation between grain boundary structure, atomic scale segregation information, and electrical activity has been established.
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Strain-Induced Asymmetric Line Segregation at Faceted Si Grain Boundaries.
Christian Liebscher,Andreas Stoffers,Masud Alam,Liverios Lymperakis,Oana Cojocaru-Mirédin,Baptiste Gault,Jörg Neugebauer,Gerhard Dehm,Christina Scheu,Dierk Raabe +9 more
TL;DR: The unique combination of atomic-scale composition measurements, employing atom probe tomography, atomic structure determination with picometer resolution by aberration-corrected scanning transmission electron microscopy, and atomistic simulations reveals site-specific linear segregation features at grain boundary facet junctions.
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Complex Nanotwin Substructure of an Asymmetric Σ9 Tilt Grain Boundary in a Silicon Polycrystal.
Andreas Stoffers,Benedikt Ziebarth,Jochen Barthel,Jochen Barthel,Oana Cojocaru-Mirédin,Christian Elsässer,Dierk Raabe +6 more
TL;DR: This work presents the complex atomic interface structure of an asymmetric Σ9 tilt grain boundary in silicon, observed by high resolution scanning transmission electron microscopy (HR-STEM) and explained by atomistic modeling and computer simulation.
Journal ArticleDOI
Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries
Andreas Stoffers,Juri Barthel,Christian Liebscher,Baptiste Gault,Oana Cojocaru-Mirédin,Oana Cojocaru-Mirédin,Christina Scheu,Dierk Raabe +7 more
TL;DR: Joint mapping of the atomistic details of the grain boundary topology, in conjunction with chemical decoration, enables a deeper understanding of the segregation of impurities observed at such grain boundaries.