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Angbo Pang
Researcher at Hong Kong University of Science and Technology
Publications - 6
Citations - 154
Angbo Pang is an academic researcher from Hong Kong University of Science and Technology. The author has contributed to research in topics: Low-energy electron microscopy & Image formation. The author has an hindex of 5, co-authored 6 publications receiving 140 citations. Previous affiliations of Angbo Pang include Huaibei Normal University.
Papers
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A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM.
TL;DR: This approach considers aberrations up to fifth order, appropriate for image formation in state-of-the-art aberration-corrected LEEM and PEEM, and calculates contrast and resolution of one-dimensional and two-dimensional pure phase, pure amplitude, and mixed phase and amplitude objects.
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Fourier optics of image formation in LEEM.
TL;DR: A Fourier optics calculation of image formation in low energy electron microscopy (LEEM), which incorporates imaging errors that are caused by the objective lens, contrast aperture, imperfect source characteristics, and voltage and current instabilities is presented.
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Step line tension and step morphological evolution on the Si(111) ( 1 × 1 ) surface
TL;DR: In this article, the temperature dependence of the step line tension on the Si(111)$ surface is determined from a capillary wave analysis of two-dimensional island edge fluctuations and straight step fluctuations that are observed with low energy electron microscopy.
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C 60 on the Pt(111) surface: Structural tuning of electronic properties
Xingqiang Shi,Angbo Pang,K. L. Man,Ruiqin Zhang,Christian Minot,Michael S. Altman,M. A. Van Hove +6 more
TL;DR: In this paper, the structure and electronic properties of the R13.R13.{9}^{\ensuremath{\circ}}$ ordered phases of the Pt(111) surface were investigated using combined dynamic low-energy electron diffraction and density functional theory (DFT) calculations.
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LEEM image phase contrast of MnAs stripes.
TL;DR: Low energy electron microscopy imaging of strained MnAs layers epitaxially grown on GaAs(001) reveals striped contrast features that become more pronounced and vary systematically in width with increasing defocus, but that are completely absent in focus.