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Benno Margesin
Researcher at fondazione bruno kessler
Publications - 192
Citations - 2559
Benno Margesin is an academic researcher from fondazione bruno kessler. The author has contributed to research in topics: Capacitive sensing & Surface micromachining. The author has an hindex of 26, co-authored 184 publications receiving 2371 citations.
Papers
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U-shaped MEMS tunable microwave resonators
Flavio Giacomozzi,Emanuela Proietti,Giovanni Capoccia,Giovanni Maria Sardi,Giancarlo Bartolucci,Jacopo Iannacci,Benno Margesin,Romolo Marcelli +7 more
TL;DR: In this article , a U-shaped microwave resonator was designed and implemented with RF MEMS switches to obtain frequency tunable narrow-band devices, and the U-shape has been used to develop a resonator optimizing its size.
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Wet release technology for bulk-silicon resonators fabrication on silicon-on-insulator substrate
TL;DR: In this article, the possibilities and the limits of the use of a solvent with low surface tension are investigated in the case of MEMS resonators fabricated on silicon-on-insulator substrate.
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Development of KIDs detectors for large submillimetric telescopes
Martino Calvo,C. Giordano,P. de Bernardis,Roberto Battiston,A. Cruciani,Benno Margesin,Silvia Masi,Alessandro Monfardini +7 more
TL;DR: In this paper, the authors present the working principle of the microwave Kinetic Inductance (KI) detectors and their status of development in Italy, focusing on the key aspects that make them ideal for large arrays of sensors.
Proceedings ArticleDOI
Influence of masking layer stress on anisotropic silicon etching in TMAH solutions
TL;DR: In this article, the relation between thin film masking layers residual stress and the orientation dependence of the silicon etching rate using TMAH solutions was studied and a lower value of anisotropy was found for higher stressed structures.
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Performance and Perspectives of Zero-Level MEMS Chip Packages with Vertical Interconnects
TL;DR: In this article, the performance of a MEMS zero-level chip cap package implemented with through-the-cap vertical interconnects is evaluated. And the hermeticity of the packages is assessed via electrical measurements of encapsulated MEMS resonators.