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Blaise Ravelo
Researcher at Nanjing University of Information Science and Technology
Publications - 233
Citations - 2399
Blaise Ravelo is an academic researcher from Nanjing University of Information Science and Technology. The author has contributed to research in topics: Group delay and phase delay & Microstrip. The author has an hindex of 21, co-authored 196 publications receiving 1727 citations. Previous affiliations of Blaise Ravelo include École Supérieure d'Ingénieurs en Génie Électrique & Nanjing University.
Papers
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Journal ArticleDOI
Cancellation of Delays in the High-Rate Interconnects with UWB NGD Active Cells
Thomas Eudes,Blaise Ravelo +1 more
TL;DR: It was demonstrated that the technique proposed brings opportunities to compensate for simultaneously the propagation delay and distortions in the interconnect effect equalization concept with NGD circuits for UWB applications.
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S-Parameter Model of Three Parallel Interconnect Lines Generating Negative Group-Delay Effect
TL;DR: A negative group-delay (NGD) microwave circuit theory regarding topology consists of three parallel interconnect lines (3-PILs) and it is shown that the simulated and measured group-delays are well-correlated.
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Behavioral Model of Symmetrical Multi-Level T-Tree Interconnects
TL;DR: An accurate and behavioral modeling method of symmet- rical T-tree interconnect network is successfully investigated and can be used during the design process of the PCB and the microelectronic circuits for the signal integrity prediction.
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Analysis of multi‐gigabits signal integrity through clock H‐tree
Thomas Eudes,Blaise Ravelo +1 more
TL;DR: A simple and accurate ultra-wide band model of multilevel distributed interconnection clock trees as a single input multiple outputs (SIMO) system is developed and very accurate single input single output (SISO) model transfer functions are derived.
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PCB Near-Field Transient Emission Time-Domain Model
TL;DR: In this paper, a radiated EMC model is built, consisting of elementary dipole array, capable of accurate reproduction of NFs emitted by electronic circuits with transient excitations of nanoseconds duration.