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Chan Hung Shek

Researcher at City University of Hong Kong

Publications -  129
Citations -  5553

Chan Hung Shek is an academic researcher from City University of Hong Kong. The author has contributed to research in topics: Amorphous metal & Alloy. The author has an hindex of 24, co-authored 121 publications receiving 4862 citations.

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Bulk metallic glasses

TL;DR: In this article, the authors reviewed the recent development of new alloy systems of bulk metallic glasses and the properties and processing technologies relevant to the industrial applications of these alloys are also discussed.
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On the thermodynamics and kinetics of electropulsing induced dissolution of β-Mg17Al12 phase in an aged Mg–9Al–1Zn alloy

TL;DR: In this article, a model for the temperature field of a strip under EPT was established based on the contributions of the coupling of the thermal and athermal effects with the free energy and the direct electron-atom interactions, the thermodynamics and kinetics of the electropulsing induced dissolution of β -Mg 17 Al 12 are discussed.
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Plasticity-improved Zr–Cu–Al bulk metallic glass matrix composites containing martensite phase

TL;DR: In this article, the formation of the martensite phase is proposed to contribute to the strain hardening and plastic deformation of the materials, while the microstructure formation strongly depends on the composition and cooling rate.
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Thermal and mechanical properties of Cu–Zr–Al bulk metallic glasses

TL;DR: In this paper, the effects of adding small amount of aluminum to the binary Cu 50 Zr 50 bulk metallic glass (BMG) on the thermal and mechanical properties were investigated, and the results showed that the nanohardness and creep displacement were dependent on the Al content.
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Synthesis and structural characterization of rutile SnO2 nanocrystals

TL;DR: In this paper, nanocrystalline tin dioxide (SnO2) thin films were prepared on glass substrate by pulse laser deposition for the first time, and they were characterized for their composition, morphology, and crystalline structure by x-ray diffraction, transmission electron microscopy, and high-resolution transmission electron microscope.