C
Christopher Liman
Researcher at National Institute of Standards and Technology
Publications - 7
Citations - 164
Christopher Liman is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Scattering & Photolithography. The author has an hindex of 4, co-authored 7 publications receiving 122 citations.
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Journal ArticleDOI
Xi-cam: a versatile interface for data visualization and analysis
Ronald Pandolfi,Daniel B. Allan,Elke Arenholz,Luis Barroso-Luque,Stuart I. Campbell,Thomas A Caswell,Austin Blair,Francesco De Carlo,Sean Fackler,Amanda P. Fournier,Guillaume Freychet,Masafumi Fukuto,Dogˇa Gürsoy,Zhang Jiang,Harinarayan Krishnan,Dinesh Kumar,R. Joseph Kline,Ruipeng Li,Christopher Liman,Stefano Marchesini,Apurva Mehta,Alpha T. N'Diaye,Dilworth Y. Parkinson,Holden Parks,Lenson A Pellouchoud,Talita Perciano,Fang Ren,Shreya Sahoo,Joseph Strzalka,Daniel F. Sunday,Christopher J. Tassone,Daniela Ushizima,Singanallur Venkatakrishnan,Kevin G. Yager,Peter H. Zwart,James A. Sethian,Alexander Hexemer +36 more
TL;DR: The core of Xi-cam is an extensible plugin-based graphical user interface platform which provides users with an interactive interface to processing algorithms, and targets cross-facility and cross-technique collaborative development, in support of multi-modal analysis.
Journal ArticleDOI
Self-Assembly of ABC Bottlebrush Triblock Terpolymers with Evidence for Looped Backbone Conformations.
Daniel F. Sunday,Alice B. Chang,Christopher Liman,Eliot Gann,Dean M. DeLongchamp,Lars Thomsen,Mark W. Matsen,Robert H. Grubbs,Christopher L. Soles +8 more
TL;DR: This work proposes that PEO blocks localize at the PS/PLA domain interfaces in order to screen the highest-χ contacts in the system, driving the formation of loops.
Journal ArticleDOI
Characterizing the Interface Scaling of High χ Block Copolymers near the Order–Disorder Transition
Daniel F. Sunday,Michael J. Maher,Adam F. Hannon,Christopher Liman,Summer Tein,Gregory Blachut,Yusuke Asano,Christopher J. Ellison,Christopher J. Ellison,C. Grant Willson,R. Joseph Kline +10 more
TL;DR: The results of this analysis are correlated with experimentally established limits for the functionality of BCPs in nanopatterning applications and provide guidance for the magnitude of χe needed to achieve small interface width for samples with sub-10 nm L0.
Journal ArticleDOI
Characterizing Patterned Block Copolymer Thin Films with Soft X-rays.
Daniel F. Sunday,Jiaxing Ren,Christopher Liman,Lance Williamson,Roel Gronheid,Paul F. Nealey,R. Joseph Kline +6 more
TL;DR: Using a rotational transmission X-ray scattering measurement coupled with soft X-rays to improve contrast between polymer components, the impact of the ratio of the guiding stripe width (W) to the BCP pitch (L0) was investigated.
Journal ArticleDOI
X-ray characterization of contact holes for block copolymer lithography.
Daniel F. Sunday,F. Delachat,Ahmed Gharbi,Guillaume Freychet,Christopher Liman,Raluca Tiron,R. Joseph Kline +6 more
TL;DR: In this paper, directed self-assembly of block copolymers (BCPs) is applied to patterning structures with critical dimensions (CDs) which are smaller than can be achieved by traditional photolithography.