The semiconductor ZnO has gained substantial interest in the research community in part because of its large exciton binding energy (60meV) which could lead to lasing action based on exciton recombination even above room temperature. Even though research focusing on ZnO goes back many decades, the renewed interest is fueled by availability of high-quality substrates and reports of p-type conduction and ferromagnetic behavior when doped with transitions metals, both of which remain controversial. It is this renewed interest in ZnO which forms the basis of this review. As mentioned already, ZnO is not new to the semiconductor field, with studies of its lattice parameter dating back to 1935 by Bunn [Proc. Phys. Soc. London 47, 836 (1935)], studies of its vibrational properties with Raman scattering in 1966 by Damen et al. [Phys. Rev. 142, 570 (1966)], detailed optical studies in 1954 by Mollwo [Z. Angew. Phys. 6, 257 (1954)], and its growth by chemical-vapor transport in 1970 by Galli and Coker [Appl. Phys. ...

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A comprehensive review of zno materials and devices

We present a comprehensive, up-to-date compilation of band parameters for the technologically important III–V zinc blende and wurtzite compound semiconductors: GaAs, GaSb, GaP, GaN, AlAs, AlSb, AlP, AlN, InAs, InSb, InP, and InN, along with their ternary and quaternary alloys. Based on a review of the existing literature, complete and consistent parameter sets are given for all materials. Emphasizing the quantities required for band structure calculations, we tabulate the direct and indirect energy gaps, spin-orbit, and crystal-field splittings, alloy bowing parameters, effective masses for electrons, heavy, light, and split-off holes, Luttinger parameters, interband momentum matrix elements, and deformation potentials, including temperature and alloy-composition dependences where available. Heterostructure band offsets are also given, on an absolute scale that allows any material to be aligned relative to any other.

Band parameters for III–V compound semiconductors and their alloys

We present a Raman scattering study of wurtzite $\mathrm{ZnO}$ over a temperature range from 80 to $750\phantom{\rule{03em}{0ex}}\mathrm{K}$ Second-order Raman features are interpreted in the light of recent ab initio phonon density of states calculations The temperature dependence of the Raman intensities allows the assignment of difference modes to be made unambiguously Some weak, sharp Raman peaks are detected whose temperature dependence suggests they may be due to impurity modes High-resolution spectra of the ${E}_{2}^{\mathrm{high}}$, ${A}_{1}(\mathrm{LO})$, and ${E}_{1}(\mathrm{LO})$ modes were recorded, and an analysis of the anharmonicity and lifetimes of these phonons is carried out The ${E}_{2}^{\mathrm{high}}$ mode displays a visibly asymmetric line shape This can be attributed to anharmonic interaction with transverse and longitudinal acoustic phonon combinations in the vicinity of the $K$ point, where the two-phonon density of states displays a sharp edge around the ${E}_{2}^{\mathrm{high}}$ frequency The temperature dependence of the linewidth and frequency of the ${E}_{2}^{\mathrm{high}}$ mode is well described by a perturbation-theory renormalization of the harmonic ${E}_{2}^{\mathrm{high}}$ frequency resulting from the interaction with the acoustic two-phonon density of states In contrast, the ${A}_{1}(\mathrm{LO})$ and ${E}_{1}(\mathrm{LO})$ frequencies lie in a region of nearly flat two-phonon density of states, and they exhibit a nearly symmetric Lorentzian line shape with a temperature dependence that is well accounted for by a dominating asymmetric decay channel

Temperature dependence of Raman scattering in ZnO

Polarized micro-Raman measurements were performed to study the phonon modes of Fe, Sb, Al, Ga, and Li doped ZnO thin films, grown by pulsed-laser deposition on c-plane sapphire substrates. Additional modes at about 277, 511, 583, and 644 cm−1, recently assigned to N incorporation [A. Kaschner et al., Appl. Phys. Lett. 80, 1909 (2002)], were observed for Fe, Sb, and Al doped films, intentionally grown without N. The mode at 277 cm−1 occurs also for Ga doped films. These modes thus cannot be related directly to N incorporation. Instead, we suggest host lattice defects as their origin. Further additional modes at 531, 631, and 720 cm−1 seem specific for the Sb, Ga, and Fe dopants, respectively. Li doped ZnO did not reveal additional modes.

Raman scattering in ZnO thin films doped with Fe, Sb, Al, Ga, and Li

We have measured nonresonant and resonant Raman-scattering spectra from ZnO nanocrystals with an average diameter of 20nm. Based on our experimental data and comparison with the recently developed theory, we show that the observed shifts of the polar optical-phonon peaks in the resonant Raman spectra are not related to the spatial phonon confinement. The very weak dispersion of the polar optical phonons in ZnO nanocrystals does not lead to any noticeable redshift of the phonon peaks for 20-nm nanocrystals. The observed phonon shifts have been attributed to the local heating effects. We have demonstrated that even the low-power ultraviolet laser excitation, required for the resonant Raman spectroscopy, can lead to the strong local heating of ZnO nanocrystals. The latter causes significant (up to 14cm−1) redshift of the optical-phonon peaks compared to their position in bulk crystals. Nonresonant Raman excitation does not produce noticeable local heating. The obtained results can be used for identification ...

Micro-Raman investigation of optical phonons in ZnO nanocrystals

We study the influence of nitrogen, a potential acceptor in ZnO, on the lattice dynamics of ZnO. A series of samples grown by chemical vapor deposition (CVD) containing different nitrogen concentrations, as determined by secondary ion mass spectroscopy (SIMS), was investigated. The Raman spectra revealed vibrational modes at 275, 510, 582, 643, and 856 cm−1 in addition to the host phonons of ZnO. The intensity of these additional modes correlates linearly with the nitrogen concentration and can be used as a quantitative measure of nitrogen in ZnO. These modes are interpreted as local vibrational modes. Furthermore, SIMS showed a correlation between the concentration of incorporated nitrogen and unintentional hydrogen, similar to the incorporation of the p-dopant magnesium and hydrogen in GaN during metalorganic CVD.

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Nitrogen-related local vibrational modes in ZnO:N

The traditional compensation model to explain the high resistivity properties of CdTe is based on the presence of a deep acceptor level of the cadmium vacancy in the middle of the band gap. A new compensation model based on a deep intrinsic donor level is presented. The compensation model is used together with an appropriate segregation model to calculate axial distributions of resistivity which are compared with spatially resolved resistivity measurements. The Te-antisite defect is discussed as a possible origin cause of this intrinsic defect, which is also supported by theoretical calculations.

Modified compensation model of CdTe

The microscopic structure of the paramagnetic anion antisite defect in semi-insulating GaAs was determined by optically detected electron-nuclear double resonance (ODENDOR). It is an arsenic-antisite--arsenic-interstitial (${\mathrm{As}}_{\mathrm{Ga}}$-${\mathrm{As}}_{\mathrm{i}}$) pair. It is shown, by optically detected ESR and ODENDOR experiments, that its energy levels and optical properties in the diamagnetic state are those of the EL2 defect.

Arsenic antisite defect AsGa and EL2 in GaAs.

The defect properties of as‐etched and annealed porous silicon are studied by electron paramagnetic resonance (EPR) and optically detected magnetic resonance (ODMR). The paramagnetic defect observed is closely related to the Pb0 center at the Si/SiO2 interface. In EPR a minimum defect density of 1016 cm−3 is observed for the as‐etched silicon, which reaches a maximum of 8×1018 cm−3 for samples annealed at about 400 °C. In the ODMR experiments, the same dangling bond center is observed on the 1.5 eV luminescence band enhancing the luminescence—but with increased sensitivity and as a decrease of the emission intensity in the infrared emission band at 1 eV of porous silicon.

Defects in porous silicon investigated by optically detected and by electron paramagnetic resonance techniques

The electron effective masses for Al0.15Ga0.35In0.5P and Ga0.5In0.5P have been investigated using conventional and optically detected cyclotron resonance. For AlGaInP (partly ordered) it is determined to be m*=(0.14±0.01) m0. For disordered GaInP the mass is found to be m*=(0.092±0.003) m0 and for ordered material (band gap reduction ∼50 meV) m*=(0.088±0.003) m0. The experimentally deduced values are compared with those obtained from five‐band k⋅p calculation.

D. M. Hofmann

Papers

Nitrogen-related local vibrational modes in ZnO:N

Modified compensation model of CdTe

Arsenic antisite defect AsGa and EL2 in GaAs.

Defects in porous silicon investigated by optically detected and by electron paramagnetic resonance techniques

Cyclotron resonance studies of GaInP and AlGaInP