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Daniel E. Adams

Researcher at Colorado School of Mines

Publications -  138
Citations -  2078

Daniel E. Adams is an academic researcher from Colorado School of Mines. The author has contributed to research in topics: Ptychography & Extreme ultraviolet lithography. The author has an hindex of 20, co-authored 138 publications receiving 1776 citations. Previous affiliations of Daniel E. Adams include National Institute of Standards and Technology & University of Colorado Boulder.

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Journal Article

Fixed-bin analysis for statistical evaluation of continuous distributions of allelic data from VNTR loci, for use in forensic comparisons.

TL;DR: A conservative statistical method was developed based on arbitrarily defined fixed bins that permits classification of continuous allelic data, provides for a simple and portable data-base system, and is unlikely to underestimate the frequency of occurrence of a set of alleles.
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Ultrahigh 22 nm resolution coherent diffractive imaging using a desktop 13 nm high harmonic source

TL;DR: A significant advance in image resolution and capabilities for desktop soft x-ray microscopes that will enable widespread applications in nanoscience and nanotechnology and shows that unique information about the sample can be obtained by extracting 3-D information at very high numerical apertures.
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Subwavelength coherent imaging of periodic samples using a 13.5 nm tabletop high-harmonic light source

TL;DR: In this paper, a tabletop, 13.5 nm high-harmonic source was used for coherent diffractive imaging of periodic samples, achieving a spatial resolution of 12.6 nm in the extreme-ultraviolet region.
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Spatio-temporally focused femtosecond laser pulses for nonreciprocal writing in optically transparent materials

TL;DR: Simultaneous spatial and temporal focusing (SSTF) provides precise control of the pulse front tilt (PFT) necessary to achieve nonreciprocal writing in glass wherein the material modification depends on the sample scanning direction with respect to the PFT.
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Tabletop nanometer extreme ultraviolet imaging in an extended reflection mode using coherent Fresnel ptychography

TL;DR: In this paper, the authors demonstrate the first general purpose full-field reflectionmode extreme ultraviolet (EUV) microscope based on coherent diffractive imaging, which is capable of nanoscale amplitude and phase imaging of extended surfaces at an arbitrary angle of incidence.