E
Emmanuel Dubois
Researcher at University of Toulouse
Publications - 247
Citations - 2999
Emmanuel Dubois is an academic researcher from University of Toulouse. The author has contributed to research in topics: Schottky barrier & Silicide. The author has an hindex of 28, co-authored 243 publications receiving 2835 citations. Previous affiliations of Emmanuel Dubois include Centre national de la recherche scientifique & University of Glasgow.
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Journal ArticleDOI
Functionalization of Silicon Nanowires for Specific Sensing
Vikram Passi,Emmanuel Dubois,Caroline Celle,Simon Clavaguera,Jean-Pierre Simonato,Jean-Pierre Raskin +5 more
TL;DR: In this paper, fabrication of silicon nanowires using top-down approach is shown, with simple calculations to determine hole mobility, hole concentration and resistivity, with and without surface functionalization under various ambient conditions.
Proceedings ArticleDOI
Fabrication and Analysis of CMOS Fully-Compatible High Conductance Impact-Ionization MOS (I-MOS) Transistors
TL;DR: In this paper, a new process to realize impact ionization MOSFETs (I-MOS) with gate length down to 50nm is reported, which assures a perfect compatibility with conventional CMOS.
Smartphone Based 3D Navigation Techniques in an Astronomical Observatory Context: Implementation and Evaluation in a Software Platform
Louis-Pierre Bergé,Gary Perelman,Adrien Hamelin,Mathieu Raynal,Cédric Sanza,Minica Houry-Panchetti,Rémi Cabanac,Emmanuel Dubois +7 more
TL;DR: The opportunity to design and implement a software platform for explaining the behavior of the Telescope Bernard-Lyot to museum visitors on top of the Pic du Midi and illustrate the benefits of the software framework by plugging alternative interaction techniques for supporting selection and manipulation task in 3D.
Journal ArticleDOI
Nonquasistatic transient model of fully-depleted SOI MOSFET and its application to the analysis of charge sharing in an analog switch
Emmanuel Dubois,E. Robilliart +1 more
TL;DR: In this article, a fast one-dimensional (1-D) numerical model suitable for circuit analysis has been developed for fully-depleted silicon-on-insulator MOSFETs.
Proceedings ArticleDOI
Investigation of High Frequency Performance for Schottky-Barrier p-MOSFET
R. Valentin,Emmanuel Dubois,Jean-Pierre Raskin,Gilles Dambrine,Guilhem Larrieu,Nicolas Breil,Francois Danneville +6 more
TL;DR: In this paper, it was shown that the loss of transconductance related to the Schottky barrier is counterbalanced by a reduction of the total gate capacitance, which is the best ever recorded fT for a p-MOSFET.