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Emmanuel Dubois

Researcher at University of Toulouse

Publications -  247
Citations -  2999

Emmanuel Dubois is an academic researcher from University of Toulouse. The author has contributed to research in topics: Schottky barrier & Silicide. The author has an hindex of 28, co-authored 243 publications receiving 2835 citations. Previous affiliations of Emmanuel Dubois include Centre national de la recherche scientifique & University of Glasgow.

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Journal ArticleDOI

Short-channel effect immunity and current capability of sub-0.1-micron MOSFET's using a recessed channel

TL;DR: In this article, the influence of the gate corner on the threshold voltage roll-off was investigated using both drift-diffusion and Monte Carlo simulations, and a steeper subthreshold slope was obtained for a channel length shorter than 50 nm when the recessed channel MOSFET is compared to its planar counterpart.
Journal ArticleDOI

Nanometer scale lithography on silicon, titanium and PMMA resist using scanning probe microscopy

TL;DR: In this paper, the thickness and width of oxide stripes are studied as a function of the applied probe-sample voltage and the speed of the tip, and exposure of PMMA resist (950 K, 3%) is also demonstrated using contact-mode AFM to control the tip/surface interaction through constant force and field emission of electrons to expose the resist.
Proceedings ArticleDOI

The Roly-Poly Mouse: Designing a Rolling Input Device Unifying 2D and 3D Interaction

TL;DR: The design and evaluation of the Roly-Poly Mouse is presented, a rolling input device that combines the advantages of the mouse and of 3D devices (roll and rotation) to unify 2D and 3D interaction.
Proceedings Article

Classification Space for Augmented Surgery, an Augmented Reality Case Study

TL;DR: OPAS is proposed as a generic framework for classifying existing AR systems and Computer Assisted Medical Interventions (CAMI), for which the added value of AR has been demonstrated by experience, are discussed in light of OPAS.
Journal ArticleDOI

Very low Schottky barrier to n-type silicon with PtEr-stack silicide

TL;DR: In this paper, the Schottky barrier of Er silicide on n-type silicon was analyzed and a simplified method of analysis considering MOSFET application has been used to characterize the structure of the PtEr-stack silicide system.