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En-Tang Kang

Researcher at National University of Singapore

Publications -  776
Citations -  41433

En-Tang Kang is an academic researcher from National University of Singapore. The author has contributed to research in topics: Polymerization & Surface modification. The author has an hindex of 97, co-authored 763 publications receiving 38498 citations. Previous affiliations of En-Tang Kang include University at Buffalo & Beijing University of Chemical Technology.

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Method for low temperature lamination of metals to polyimides

TL;DR: In this paper, a method for the surface modification of polyimides and derivatives by thermal graft copolymerization and interfacial polymerization with concurrent lamination of the metal of interest in the presence of an appropriate functional monomer is presented.
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Polyurethane‐based composites with promising antibacterial properties

TL;DR: In this paper , the cutting edge of inorganic and organic-based polyurethane composites for antibacterial applications is addressed, and selective examples of scientific reports' key findings and their crucial information on PU composites are discussed.
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XPS investigation of electrode/polymer interfaces of relevance to the phenylene vinylene polymer-based LEDs

TL;DR: In this article, X-ray photoelectron spectroscopy (XPS) was employed for the study of physicochemical interactions at electrode/polymer interfaces involving metals of high and low work functions and thin films of poly(p-phenylene vinylene) (PPV) and poly[2-methoxy-5-(2'-ethyl-hexyloxy)-1,4-phenylon vinylene] (MEH-PPV).
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Self‐Adjuvanted Molecular Activator (SeaMac) Nanovaccines Promote Cancer Immunotherapy

TL;DR: In this paper, the design and synthesis of nanovaccines are reported, based on self-adjuvanted, polymer nanoparticles with in vivo neoantigen harvesting and molecular activating capabilities.
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Chemical modification of Si(100) surface by consecutive graft polymerization of 4-vinylaniline and aniline

TL;DR: In this article, the graft-modified Si surface was characterized by X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and electrical resistance measurements.