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Felix Cüppers

Researcher at Forschungszentrum Jülich

Publications -  13
Citations -  331

Felix Cüppers is an academic researcher from Forschungszentrum Jülich. The author has contributed to research in topics: Neuromorphic engineering & Resistive random-access memory. The author has an hindex of 4, co-authored 9 publications receiving 125 citations.

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Journal ArticleDOI

Improved Switching Stability and the Effect of an Internal Series Resistor in HfO 2 /TiO x Bilayer ReRAM Cells

TL;DR: In this article, the authors discuss the physical origin of the significant reduction in the switching variability of HfO2-based devices achieved by the insertion of a thin TiO x layer between the HFO2 layer and the oxygen exchange metal layer.
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Exploiting the switching dynamics of HfO 2 -based ReRAM devices for reliable analog memristive behavior

TL;DR: In this paper, the authors show that analog and binary conductance modulation can be achieved in a Pt/HfO2/TiOx/Ti VCM cell by varying the operation conditions.
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Variability-Aware Modeling of Filamentary Oxide-Based Bipolar Resistive Switching Cells Using SPICE Level Compact Models

TL;DR: Variability found in experimental measurements can be reproduced for important device characteristics such as I-V characteristics, endurance behavior and most significantly the SET and RESET kinetics, which enables the study of spatial and temporal variability and its impact on the circuit and system level.
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Understanding the Coexistence of Two Bipolar Resistive Switching Modes with Opposite Polarity in Pt/TiO2/Ti/Pt Nanosized ReRAM Devices.

TL;DR: This work reports on nanosized asymmetric memristive cells from 3 to 6 nm thick TiO2 films by atomic layer deposition, which reveal a coexistence of c8w and 8w switching in the same cell, and proposes a model, which explains 8w BRS by an oxygen transfer process across the Pt/TiO2 Schottky interface.
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Utilizing the Switching Stochasticity of HfO2/TiOx-Based ReRAM Devices and the Concept of Multiple Device Synapses for the Classification of Overlapping and Noisy Patterns.

TL;DR: In this paper, the authors present an experimental analysis of d2d and c2c variability of filamentary-type bipolar switching HfO2/TiOx nano-sized crossbar devices and match the experimentally observed variabilities to their physically motivated JART VCM compact model.