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Frederick Alyious List

Researcher at Oak Ridge National Laboratory

Publications -  54
Citations -  5797

Frederick Alyious List is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Texture (crystalline) & Layer (electronics). The author has an hindex of 25, co-authored 53 publications receiving 5078 citations. Previous affiliations of Frederick Alyious List include Martin Marietta Materials, Inc. & University of Tennessee.

Papers
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Transparent superhydrophobic surfaces using a spray coating process

TL;DR: In this article, a scalable approach for applying antisoiling coatings based on super-hydrophobic (SH) silica particles using a spray coating process is described, which will help reduce costs of periodic cleaning of solar energy conversion systems (photovoltaic panels and concentrated solar mirrors).
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Alternating current losses in biaxially textured YBa2Cu3O7−δ films deposited on Ni tapes

TL;DR: YBa2Cu3O7−δ films grown on rolling-assisted biaxially textured substrates carry critical current densities 105-106 A/cm2 at 77 K and low applied magnetic fields.
Journal ArticleDOI

Continuous growth of epitaxial CeO2 buffer layers on rolled Ni tapes by electron beam evaporation

TL;DR: In this paper, an integral reel-to-reel, electron beam evaporation system was developed to continuously deposit epitaxial CeO2 and other oxide buffer layers on meter long-lengths of rolled Ni tapes.
Journal ArticleDOI

Heteroepitaxial film crystal silicon on Al2O3: new route to inexpensive crystal silicon photovoltaics

TL;DR: In this paper, the authors reported two related advances toward film c-Si photovoltaics on inexpensive metal foils, which achieved ∼400 mV of open-circuit voltage despite crystallographic defects caused by lattice mismatch between the silicon and underlying substrate.
Patent

High Tc YBCO superconductor deposited on biaxially textured Ni substrate

TL;DR: In this article, a superconducting article includes a biaxially-textured Ni substrate, and epitaxial buffer layers of Pd (optional), CeO 2 and YSZ, and a top layer of in-plane aligned, c-axis oriented YBCO having a critical current density in the range of at least 100,000 A/cm 2 at 77 K.