G
G. C. A. M. Janssen
Researcher at Delft University of Technology
Publications - 65
Citations - 933
G. C. A. M. Janssen is an academic researcher from Delft University of Technology. The author has contributed to research in topics: Thin film & Chemical vapor deposition. The author has an hindex of 15, co-authored 65 publications receiving 856 citations.
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Journal ArticleDOI
Edge and Surface Plasmons in Graphene Nanoribbons.
Zhe Fei,Zhe Fei,Michael Goldflam,Jhih-Sheng Wu,Siyuan Dai,Martin Wagner,Alexander McLeod,Mengkun Liu,Kirk Post,Shou-En Zhu,G. C. A. M. Janssen,Michael M. Fogler,Dimitri Basov +12 more
TL;DR: Nano-infrared imaging studies of confined plasmon modes inside patterned graphene nanoribbons fabricated with high-quality chemical-vapor-deposited (CVD) graphene on Al2O3 substrates show distinct mode patterns and strong field enhancement, both of which evolve systematically with the ribbon width.
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Young’s modulus measurements and grain boundary sliding in free-standing thin metal films
TL;DR: In this article, Young's modulus of free-standing polycrystalline Al, Au, and W films with submicron thickness has been studied using a dynamic bulge-testing technique.
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Stress in hard metal films
TL;DR: In this article, it was shown that the tensile component of the stress in the polycrystalline hard metal films is generated at the grain boundaries and therefore depends on film thickness.
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Tensile stress in hard metal films
TL;DR: In this paper, the authors explain the occurrence of tensile stress in non-recrystallizing metal films based on modern grain growth models and accurate stress measurements, and prove the existence of a stress gradient.
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High-temperature bulge-test setup for mechanical testing of free-standing thin films
TL;DR: In this article, the elastic and plastic properties of free-standing thin film samples between room temperature and at least 300°C were measured using a scanning laser beam technique. Butler et al. developed a bulge-test setup which enables measurement of the elastic properties of thin Al films.