G
Georg Schitter
Researcher at Vienna University of Technology
Publications - 278
Citations - 6886
Georg Schitter is an academic researcher from Vienna University of Technology. The author has contributed to research in topics: Actuator & Computer science. The author has an hindex of 35, co-authored 236 publications receiving 6023 citations. Previous affiliations of Georg Schitter include University of California, Santa Barbara & École Polytechnique Fédérale de Lausanne.
Papers
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Journal ArticleDOI
Threshold voltage shift in organic field effect transistors by dipole monolayers on the gate insulator
K. P. Pernstich,Simon Haas,D. Oberhoff,C. Goldmann,David J. Gundlach,Bertram Batlogg,A. N. Rashid,Georg Schitter +7 more
TL;DR: In this paper, the authors demonstrate controllable shift of the threshold voltage and the turn-on voltage in pentacene thin film transistors and rubrene single crystal field effect transistors by the use of nine organosilanes with different functional groups.
Journal ArticleDOI
Threshold Voltage Shift in Organic Field Effect Transistors by Dipole-Monolayers on the Gate Insulator
K. P. Pernstich,A. N. Rashid,Simon Haas,Georg Schitter,D. Oberhoff,C. Goldmann,David J. Gundlach,Bertram Batlogg +7 more
TL;DR: In this paper, the authors demonstrate controllable shift of the threshold voltage and the turn-on voltage in pentacene thin film transistors and rubrene single crystal field effect transistors by the use of nine organosilanes with different functional groups.
Journal ArticleDOI
Design and Modeling of a High-Speed AFM-Scanner
Georg Schitter,Karl Johan Åström,Barry E. DeMartini,Philipp J. Thurner,Kimberly L. Turner,Paul K. Hansma +5 more
TL;DR: A second- and a fourth-order mathematical model of the scanner are derived that allow new insights into important design parameters and the performance of the new AFM is demonstrated by imaging a calibration grating and a biological sample at 8 frames/s.
Journal ArticleDOI
High performance feedback for fast scanning atomic force microscopes
TL;DR: In this article, the authors identify the dynamics of an atomic force microscope (AFM) in order to design a feedback controller that enables faster image acquisition at reduced imaging error compared to the now generally employed proportional integral differential (PID) controllers.
Journal ArticleDOI
Sacrificial bonds and hidden length: unraveling molecular mesostructures in tough materials.
Georg E. Fantner,Emin Oroudjev,Georg Schitter,Laura S. Golde,Philipp J. Thurner,Marquesa M. Finch,Patricia Turner,Thomas Gutsmann,Daniel E. Morse,Helen G. Hansma,Paul K. Hansma +10 more
TL;DR: By close analysis of the force spectroscopy curves, additional information can be obtained about the molecules and their bonds to the native constructs and how they appear in single molecule forceSpectroscopy measurements are found.