H
H.H.K. Tang
Researcher at IBM
Publications - 30
Citations - 1279
H.H.K. Tang is an academic researcher from IBM. The author has contributed to research in topics: Single event upset & Soft error. The author has an hindex of 16, co-authored 30 publications receiving 1210 citations.
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Journal ArticleDOI
Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground
TL;DR: In this paper, ground-based measurements of the cosmic-ray induced neutron flux and its energy distribution have been made at several locations across the United States using an extended energy Bonner sphere spectrometer.
Journal ArticleDOI
Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells
TL;DR: In this article, experimental data showed that low energy (<2 MeV) proton irradiation can upset exploratory 65 nm node, silicon-on-insulator circuits and suggested that track structures need to be understood and effectively modeled, especially for small, modern devices.
Proceedings ArticleDOI
Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiation
TL;DR: In this paper, the authors developed a unique and comprehensive computer program (SEMM) to calculate the probability of soft failure in integrated circuits due to alpha particles emanating from the chip materials and due to terrestrial cosmic rays.
Journal ArticleDOI
SEMM-2: a modeling system for single event upset analysis
H.H.K. Tang,Ethan H. Cannon +1 more
TL;DR: SEMM-2 is described, a new simulation system for the analysis of radiation-induced single event upsets which builds on the initial SEMM tool and improves the generation of radiation events.
Journal ArticleDOI
Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects
Robert A. Reed,Robert A. Weller,A. Akkerman,J. Barak,W. Culpepper,Sophie Duzellier,C.C. Foster,Marc Gaillardin,Guillaume Hubert,T.M. Jordan,Insoo Jun,Steven L. Koontz,Fan Lei,P.J. McNulty,Marcus H. Mendenhall,M. Murat,Pentti Nieminen,P. M. O’Neill,Melanie Raine,Brandon Reddell,Frédéric Saigné,Giovanni Santin,Lembit Sihver,H.H.K. Tang,Pete Truscott,Frédéric Wrobel +25 more
TL;DR: In this paper, the authors present contributions from eleven different groups, each developing and/or applying Monte Carlo-based radiation transport tools to simulate a variety of effects that result from energy transferred to a semiconductor material by a single particle event.