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Hans Peter Herzig

Researcher at École Polytechnique Fédérale de Lausanne

Publications -  466
Citations -  8437

Hans Peter Herzig is an academic researcher from École Polytechnique Fédérale de Lausanne. The author has contributed to research in topics: Microlens & Surface wave. The author has an hindex of 46, co-authored 466 publications receiving 7929 citations. Previous affiliations of Hans Peter Herzig include Novartis & University of Neuchâtel.

Papers
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Journal ArticleDOI

Design, fabrication and testing of microlens arrays for sensors and microsystems

TL;DR: In this article, the authors report on their activities in design, fabrication, characterization and system integration of refractive microlens arrays for sensors and microsystems, including neural networks and multiple pupil imaging systems for photolithography.
Reference BookDOI

Micro-Optics : Elements, Systems And Applications

TL;DR: In this paper, the authors describe the design of refractive and diffractive micro-optics, H.P. Herzig diffaction theory of microrelief gratings, J.N. Stern direct writing of continuous-relief microoptics and M.T. Gale free space integrated optics.
Journal Article

Characterization of buried photonic crystal waveguides and microcavities fabricated by deep ultraviolet lithography

TL;DR: In this paper, the optical characterization of silicon photonic crystal waveguides and microcavities that are completely buried in a silicon dioxide cladding and are fabricated by deep ultraviolet (UV) lithography is discussed.
Journal ArticleDOI

Comparing glass and plastic refractive microlenses fabricated with different technologies

TL;DR: In this article, the most important fabrication techniques for glass and plastic refractive microlenses and corresponding state-of-the-art micro-lenses, which were obtained from selected research groups, were reviewed and discussed.
Journal ArticleDOI

Miniaturized time-scanning Fourier transform spectrometer based on silicon technology

TL;DR: In this article, a miniaturized Fourier transform spectrometer (FTS) based on optical microelectromechanical system technology is presented, which is a Michelson interferometer with one scanning mirror.