H
Hushan Cui
Researcher at Chinese Academy of Sciences
Publications - 37
Citations - 482
Hushan Cui is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Tunnel magnetoresistance & Wafer. The author has an hindex of 11, co-authored 36 publications receiving 356 citations. Previous affiliations of Hushan Cui include Beihang University & Katholieke Universiteit Leuven.
Papers
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Journal ArticleDOI
State of the Art and Future Perspectives in Advanced CMOS Technology.
Henry H. Radamson,Huilong Zhu,Zhenhua Wu,Xiaobin He,Hongxiao Lin,Jinbiao Liu,Jinjuan Xiang,Zhenzhen Kong,Wenjuan Xiong,Junjie Li,Hushan Cui,Jianfeng Gao,Hong Yang,Yong Du,Buqing Xu,Ben Li,Xuewei Zhao,Xuewei Zhao,Jiahan Yu,Yan Dong,Guilei Wang +20 more
TL;DR: New architectures, simulation methods, and process technology for nano-scale transistors on the approach to the end of ITRS technology are presented and new metrology techniques that may appear in the near future are discussed.
Journal ArticleDOI
Miniaturization of CMOS.
Henry H. Radamson,Henry H. Radamson,Xiaobin He,Qingzhu Zhang,Jinbiao Liu,Hushan Cui,Jinjuan Xiang,Zhenzhen Kong,Wenjuan Xiong,Junjie Li,Jianfeng Gao,Hong Yang,Shihai Gu,Xuewei Zhao,Xuewei Zhao,Yong Du,Jiahan Yu,Guilei Wang +17 more
TL;DR: This article presents how the MOSFET structure and process have been changed (or modified) to follow the More Moore strategy.
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The Challenges of Advanced CMOS Process from 2D to 3D
Henry H. Radamson,Yanbo Zhang,Xiaobin He,Hushan Cui,Junjie Li,Jinjuan Xiang,Jinbiao Liu,Shihai Gu,Guilei Wang +8 more
TL;DR: In this paper, the transition from 2D planar MOSFETs to 3D fin field effective transistors (FinFET) is discussed and the process flow faces different technological challenges.
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N-Doped graphene frameworks with superhigh surface area: excellent electrocatalytic performance for oxygen reduction.
TL;DR: NGFs synthesized from the rapid pyrolysis of solid glycine particles in the presence of sodium carbonate, display an extremely large specific surface area and a graphitic-N-dominant C-N configuration and can efficiently catalyze the electrochemical reduction of molecular oxygen into water following a 4e pathway, much better than the commercial Pt/C catalyst.
Journal ArticleDOI
Investigation of the interface between LPCVD-SiNx gate dielectric and III-nitride for AlGaN/GaN MIS-HEMTs
Zhaoyang Liu,Sen Huang,Qilong Bao,Xinhua Wang,Ke Wei,Haojie Jiang,Hushan Cui,Junfeng Li,Chao Zhao,Xinyu Liu,Jinhan Zhang,Qi Zhou,Wanjun Chen,Bo Zhang,Lifang Jia +14 more
TL;DR: In this article, the interface between silicon nitride (SiNx) gate dielectric grown by low pressure chemical vapor deposition (LPCVD) and III-nitride heterostructure is investigated by a systematical comparison of AlGaN/GaN high-electron-mobility transistors (HEMTs) and metal-insulator-semiconductor HEMTs (MIS-HEMT).