scispace - formally typeset
J

Jaehyun Yang

Researcher at Sungkyunkwan University

Publications -  14
Citations -  2014

Jaehyun Yang is an academic researcher from Sungkyunkwan University. The author has contributed to research in topics: Layer (electronics) & Thin-film transistor. The author has an hindex of 11, co-authored 14 publications receiving 1804 citations.

Papers
More filters
Journal ArticleDOI

High-mobility and low-power thin-film transistors based on multilayer MoS2 crystals

TL;DR: This is the first comprehensive investigation of process-friendly multilayer molybdenum disulphide field-effect transistors and their results provide potentially important implications in the fabrication of high-resolution large-area displays and further scientific investigation of various physical properties expected in other layered semiconductors.
Journal ArticleDOI

Improved growth behavior of atomic-layer-deposited high-k dielectrics on multilayer MoS2 by oxygen plasma pretreatment.

TL;DR: The results indicate that the surface modification of MoS2 by oxygen plasma treatment can have a major impact on the subsequent deposition of high-k thin films, with important implications on their integration in thin film transistors.
Journal ArticleDOI

MoS2–InGaZnO Heterojunction Phototransistors with Broad Spectral Responsivity

TL;DR: The photoresponse characteristics of the a-IGZO transistor are extended to cover most of the visible range by forming a heterojunction phototransistor that harnesses a visible light responding MoS2 film with a small band gap prepared through a large-area synthetic route.
Journal ArticleDOI

Wafer-scale synthesis of thickness-controllable MoS2 films via solution-processing using a dimethylformamide/n-butylamine/2-aminoethanol solvent system

TL;DR: The highly thickness controllable growth of uniform MoS2 thin films on the wafer-scale via a spin-coating route is reported and various characterization results reveal that the synthesizedMoS2 film has wower-scale homogeneity with excellent crystalline quality and a stoichiometric chemical composition.
Journal ArticleDOI

Thickness scaling of atomic-layer-deposited HfO2 films and their application to wafer-scale graphene tunnelling transistors.

TL;DR: The application of various surface modification methods on monolayer graphene sheets grown by chemical vapour deposition is assessed to obtain a uniform and pinhole-free ALD HfO2 film with a substantially small CET at a wafer scale.