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Jahnavi Sharma

Researcher at Intel

Publications -  18
Citations -  307

Jahnavi Sharma is an academic researcher from Intel. The author has contributed to research in topics: CMOS & Phase-locked loop. The author has an hindex of 8, co-authored 16 publications receiving 231 citations. Previous affiliations of Jahnavi Sharma include Columbia University & IBM.

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Journal ArticleDOI

Calibration-Kit Design for Millimeter-Wave Silicon Integrated Circuits

TL;DR: In this paper, the authors present design guidelines for thru-reflect-line vector-network-analyzer calibration kits used for characterizing circuits and transistors fabricated on silicon integrated circuits at millimeter-wave frequencies.
Journal ArticleDOI

216- and 316-GHz 45-nm SOI CMOS Signal Sources Based on a Maximum-Gain Ring Oscillator Topology

TL;DR: In this paper, a maximum-gain ring oscillator (MGRO) topology was proposed to maximize the power gain achieved by the active devices in a ring oscillators using appropriately designed passive matching networks to maximize frequency of oscillation.
Journal ArticleDOI

A 2.4-GHz Reference-Sampling Phase-Locked Loop That Simultaneously Achieves Low-Noise and Low-Spur Performance

TL;DR: A new dividerless Type-I sampling PLL, called the RS-PLL, which estimates the voltage-controlled oscillator (VCO) phase error by sampling the reference sine wave with a VCO square wave is demonstrated, and improves upon the simultaneous noise and spur performance achieved by current state-of-the-art clock multipliers.
Proceedings ArticleDOI

Silicon Optical Phased Array with Grating Lobe-Free Beam Formation Over 180 Degree Field of View

TL;DR: In this paper, the first optical phased array with half-wavelength emitter pitch was demonstrated using index-mismatched waveguides and showed operation without grating lobes over an entire 180° field of view.
Journal ArticleDOI

Calibrations for Millimeter-Wave Silicon Transistor Characterization

TL;DR: In this article, the authors compare on-wafer through-reflect-line (TRL) and short-open-load-thru (SOLT) and LRRM probe-tip calibrations for amplifier characterization and parasitic extraction for transistor characterization on silicon integrated circuits at millimeter-wave frequencies.