J
Jeffrey W. Kysar
Researcher at Columbia University
Publications - 148
Citations - 24473
Jeffrey W. Kysar is an academic researcher from Columbia University. The author has contributed to research in topics: Deformation (engineering) & Electron backscatter diffraction. The author has an hindex of 35, co-authored 139 publications receiving 21356 citations. Previous affiliations of Jeffrey W. Kysar include Columbia University Medical Center & Harvard University.
Papers
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Journal ArticleDOI
Grain size dependence of polycrystalline plasticity modeling in cylindrical indentation
TL;DR: In this article, a nonlocal continuum model that encompasses the heterogeneity in yield strength based on the exponentiated Weibull function can predict the plastic properties of materials in the micron length scale.
Journal ArticleDOI
Experimental Investigation of Plastic Strain Recovery and Creep in Nanocrystalline Copper Thin Films
N. Ghazi,Jeffrey W. Kysar +1 more
TL;DR: In this paper, the diffusive mechanism and the strain rates for nanocrystalline thin films of copper with an average grain size of about 35 nm during plastic strain recovery and creep are explored.
Patent
System and method to locally deliver therapeutic agent to inner ear
Anil K. Lalwani,Jeffrey W. Kysar +1 more
TL;DR: In this article, the authors described a system and method for delivery of therapeutic agent to the inner ear using a plurality of micro-needles which can be delivered to the round window membrane by a delivery device, e.g. catheter.
Patent
Force, pressure, or stiffness measurement or calibration using graphene or other sheet membrane
TL;DR: In this article, a deformable sheet membrane can be configured to include a specified integer number of one or more monolayers, and a storage medium can comprise information about the suspended membrane or the substrate that, with a deflection displacement response of the suspension membrane to an applied force or pressure, provides a measurement of the applied force and pressure.
Proceedings ArticleDOI
Spatially resolved characterization of residual stress induced by micro scale laser shock Peening
TL;DR: In this paper, a single crystal aluminum of (001) orientation was shock peened using laser beam of 12 micron diameter and observed with X-ray micro-diffraction techniques based on a synchrotron light source.