J
Jody Fronheiser
Researcher at General Electric
Publications - 45
Citations - 1762
Jody Fronheiser is an academic researcher from General Electric. The author has contributed to research in topics: Avalanche photodiode & Single-photon avalanche diode. The author has an hindex of 11, co-authored 45 publications receiving 1709 citations.
Papers
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Journal ArticleDOI
Time Resolved Photoconduction Studies of Uniformly Doped and p-n Junction Si Nanowires
Loucas Tsakalakos,Darryl Michael,Jody Fronheiser,Joleyn Balch,Robert Wortman,Paul Russell Wilson,David William White,Rolf Boone,Stephen F. LeBoeuf +8 more
TL;DR: In this paper, the time resolved and DC photoconduction characteristics of Si nanowire devices are described, and it is shown that under certain biasing conditions, illumination with light from light emitting diodes with wavelengths ranging from 480 nm to 625 nm causes changes in current as high as 4%.
Patent
Sensor system and methods for environmental sensing
TL;DR: In this article, a sensor system, and an associated method for detecting harsh environmental conditions, is provided, which includes at least one sensor having an electrical sensing element, based on certain classes of composite materials.
Proceedings ArticleDOI
Interaction of Light with Si Nanowire Films
L. Tsakalakos,Joleyn Balch,Jody Fronheiser,M.-Y. Shih,Steven Francis Leboeuf,M. Pietrzykowski,Peter J. Codella,O. Sulima,James A. Rand,A.D. Kumar,Bastian Arie Korevaar +10 more
TL;DR: In this paper, the optical properties of silicon nanowire arrays fabricated on bulk Si and glass substrates are reported, and the observed reflectance is related to the so-called moth-eye effect.
Journal ArticleDOI
Evaluation of 4H-SiC Carbon Face Gate Oxide Reliability
Jody Fronheiser,Aveek N. Chatterjee,Ulrike Grossner,Kevin Matocha,Vinayak Tilak,Liangchun Yu +5 more
TL;DR: In this article, the gate oxide reliability and channel mobility of carbon face (000-1) 4H Silicon Carbide (SiC) MOSFETs were investigated.