J
Jose Rebollo
Researcher at Spanish National Research Council
Publications - 135
Citations - 2907
Jose Rebollo is an academic researcher from Spanish National Research Council. The author has contributed to research in topics: Power semiconductor device & Transistor. The author has an hindex of 17, co-authored 133 publications receiving 2251 citations.
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A Survey of Wide Bandgap Power Semiconductor Devices
TL;DR: In this article, a review of recent progresses in the development of SiC- and GaN-based power semiconductor devices together with an overall view of the state of the art of this new device generation is presented.
Análisis territorial del turismo y planificación de destinos turísticos
TL;DR: In this article, a formalización de los procesos de ordenacion, planificación, and gestion de areas and destinos turisticos, destacando la sistematizacion de las herramientas for llevar a cabo suchos proceso.
Journal ArticleDOI
Power module electronics in HEV/EV applications: New trends in wide-bandgap semiconductor technologies and design aspects
TL;DR: This work focuses on an in-deep review of the state of the art concerning the power module, identifying the electrical requirements for the modules and the power conversion topologies that will best suit future drives.
Journal ArticleDOI
Advanced processing for mobility improvement in 4H-SiC MOSFETs: A review
TL;DR: In this article, advanced gate dielectric processes for SiC MOSFETs are reviewed, and the use of high-k dielectrics is also analyzed, together with the impact of different crystal orientations on the channel mobility.
Journal ArticleDOI
Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions
Xavier Perpiñà,Jean-François Serviere,J. Urresti-Ibanez,I. Cortes,X. Jorda,Salvador Hidalgo,Jose Rebollo,Michel Mermet-Guyennet +7 more
TL;DR: Results show that mismatches in the electrothermal properties of the IGBT device during transient operation can lead to uneven power dissipation, significantly enhancing the risk of failure and reducing the lifetime of the power module.