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Justin Ye

Researcher at University of Tokyo

Publications -  6
Citations -  1246

Justin Ye is an academic researcher from University of Tokyo. The author has contributed to research in topics: Field-effect transistor & Electrochemical cell. The author has an hindex of 4, co-authored 6 publications receiving 1105 citations. Previous affiliations of Justin Ye include Tohoku University & University of Groningen.

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Electrically Switchable Chiral Light-Emitting Transistor

TL;DR: The device demonstrates a route to exploit the valley degree of freedom and the possibility to develop a valley-optoelectronics technology and reports an electrically switchable, circularly polarized light source based on the material’s valleydegree of freedom.
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Liquid-gated interface superconductivity on an atomically flat film

TL;DR: The present result reveals that the EDLT is an extremely versatile tool to induce electronic phase transitions by electrostatic charge accumulation and provides new routes in the search for superconductors beyond those synthesized by traditional chemical methods.
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Interface transport properties in ion-gated nano-sheets

TL;DR: In this article, the authors present a short review on liquid/solid interfaces formed on nano-sheets prepared by micro cleaving a bulk layered single crystal, which can be electrostatically doped to a high carrier density of ∼1014 cm−2.
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Gate-Induced Superconductivity in Layered-Material-Based Electric Double Layer Transistors

TL;DR: In this article, the authors utilized micro-cleavage on a number of interesting layered materials and realized high carrier density state and high performance transport on atomically flat surfaces, where the carrier density regime of n~1014 cm−2 can be easily accessed without chemical modification.
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Creating Novel Transport Properties in Electric Double Layer Field Effect Transistors Based on Layered Materials

TL;DR: In this article, the authors present a study on the liquid/solid interface, which can be electrostatically doped to a high carrier density (n~1014 cm−2) by electric-double-layer gating.