K
Kurt Hingerl
Researcher at Johannes Kepler University of Linz
Publications - 253
Citations - 4403
Kurt Hingerl is an academic researcher from Johannes Kepler University of Linz. The author has contributed to research in topics: Photonic crystal & Metamaterial. The author has an hindex of 32, co-authored 243 publications receiving 3994 citations. Previous affiliations of Kurt Hingerl include EV Group.
Papers
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Journal ArticleDOI
Fabrication, Optical Modeling, and Color Characterization of Semitransparent Bulk-Heterojunction Organic Solar Cells in an Inverted Structure
Tayebeh Ameri,Gilles Dennler,Christoph Waldauf,Hamed Azimi,Andrea Seemann,Karen Forberich,Jens Hauch,Markus C. Scharber,Kurt Hingerl,Christoph J. Brabec +9 more
TL;DR: In this paper, optical simulations for a semitransparent device of poly(3-hexylthiophene) (P3HT) and the C60 derivative 1-(3-methoxycarbonyl)propyl-1-phenyl[6,6]C71 (PC70BM) in the inverted structure are presented.
Journal ArticleDOI
Nanomorphology and Charge Generation in Bulk Heterojunctions Based on Low‐Bandgap Dithiophene Polymers with Different Bridging Atoms
Mauro Morana,Hamed Azimi,Gilles Dennler,Hans-Joachim Egelhaaf,Markus C. Scharber,Karen Forberich,Jens Hauch,Russell Gaudiana,David Waller,Zenghuo Zhu,Kurt Hingerl,SS Svetlana van Bavel,J Joachim Loos,Christoph J. Brabec +13 more
TL;DR: In this paper, a morphological changes are observed in polymer:fullerene bulk heterojunctions upon the substitution of the bridging atom, which is a promising class of low bandgap materials.
Journal ArticleDOI
Angle dependence of external and internal quantum efficiencies in bulk-heterojunction organic solar cells
Gilles Dennler,Karen Forberich,Markus C. Scharber,Christoph J. Brabec,Igor Tomiš,Kurt Hingerl,Thomas Fromherz +6 more
TL;DR: In this article, the optical properties of poly(3-hexylthiophene): 1-(3-methoxy-carbonyl) propyl-1-phenyl[6,6]C61 based solar cells with two different thicknesses of the active layer (170 and 880nm) were investigated, and it was shown that in the thin ones the absorption is enhanced for oblique incident radiation.
Journal ArticleDOI
Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives
Maria Losurdo,Michael Bergmair,Giovanni Bruno,Denis Cattelan,Christoph Cobet,Antonello De Martino,Karsten Fleischer,Zorana Dohčević-Mitrović,Norbert Esser,Melanie Galliet,Radoš Gajić,Dušan Hemzal,Kurt Hingerl,Josef Humlíček,Razvigor Ossikovski,Zoran B. Popović,Ottilia Saxl +16 more
TL;DR: It is shown that ellipsometry is capable of more than the determination of thickness and optical properties, and it can be exploited to gain information about process control, geometry factors, anisotropy, defects, and quantum confinement effects of nanostructures.
BookDOI
Ellipsometry at the nanoscale
Maria Losurdo,Kurt Hingerl +1 more
TL;DR: A brief history and state-of-the-art state of the art of spectroscopic ellipsometry can be found in this paper, along with an overview of the application of the Mueller matrix applied to nanostructures.