L
Laung-Terng Wang
Researcher at Kyushu Institute of Technology
Publications - 80
Citations - 2958
Laung-Terng Wang is an academic researcher from Kyushu Institute of Technology. The author has contributed to research in topics: Automatic test pattern generation & Fault coverage. The author has an hindex of 28, co-authored 80 publications receiving 2927 citations. Previous affiliations of Laung-Terng Wang include Stanford University.
Papers
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Book
VLSI Test Principles and Architectures: Design for Testability
TL;DR: A comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time to market and time-to-volume as mentioned in this paper.
Proceedings ArticleDOI
On low-capture-power test generation for scan testing
TL;DR: Experimental results show the effectiveness of the novel low-capture-power X-filling method in reducing capture power dissipation without any impact on area, timing, and fault coverage.
Proceedings ArticleDOI
Low-capture-power test generation for scan-based at-speed testing
Xiaoqing Wen,Y. Yamashita,Shohei Morishima,Seiji Kajihara,Laung-Terng Wang,Kewal K. Saluja,Kozo Kinoshita +6 more
TL;DR: A novel low-capture-power X-filling method of assigning 0's and 1's to unspecified (X) bits in a test cube obtained during ATPG to improve the applicability of scan-based at-speed testing by reducing the risk of test yield loss.
Patent
Computer-aided design system to automate scan synthesis at register-transfer level
Laung-Terng Wang,Xiaoqing Wen +1 more
TL;DR: In this paper, a method and system to automate scan synthesis at register-transfer level (RTL) is presented. But this method is not suitable for the verification of scan HDL code.