BookDOI
VLSI Test Principles and Architectures
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The article was published on 2006-01-01. It has received 157 citations till now.read more
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Proceedings ArticleDOI
Survey of low power testing of VLSI circuits
P. Basker,A. Arulmurugan +1 more
TL;DR: Low power dissipation during test application is becoming increasingly important in today's V LSI systems design and is a major goal in the future development of VLSI design.
Journal ArticleDOI
On Topology Reconfiguration for Defect-Tolerant NoC-Based Homogeneous Manycore Systems
TL;DR: In this paper, the authors propose to achieve fault tolerance by employing redundancy at the core level instead of at the micro-architecture level, which not only maximizes the performance of the on-chip communication scheme, but also provides a unified topology to operating system and application software running on the processor.
Proceedings ArticleDOI
X-canceling MISR — An X-tolerant methodology for compacting output responses with unknowns using a MISR
TL;DR: The tester storage requirement is a small constant times the total number of unknowns in the test set and thus does not depend on the scan architecture, the number of test vectors, or the distribution of X's which is a key advantage compared with other X-tolerance compaction schemes.
Fault Tolerance - On Topology Reconfiguration for Defect-Tolerant NoC-Based Homogeneous Manycore Systems
TL;DR: This paper proposes to achieve fault tolerance by employing redundancy at the core-level instead of at the microarchitecture level, which will maximize the performance of the on-chip communication scheme, and provide a unified topology to Operating System and application software running on the processor.
Journal ArticleDOI
Test Versus Security: Past and Present
Jean Da Rolt,Amitabh Das,Giorgio Di Natale,Marie-Lise Flottes,Bruno Rouzeyre,Ingrid Verbauwhede +5 more
TL;DR: A detailed survey on the state-of-the-art in scan-based side-channel attacks on symmetric and public-key cryptographic hardware implementations, both in the absence and presence of advanced DfT structures, such as test compression and X-masking, which may make the attack difficult.