Lucyna Grządziel

TL;DR: The detailed analysis of lab-recorded photoemission spectra in combination with Kelvin probe data yielded the work function, ionization energy, and valence band - Fermi level separation - and hence enabled the construction of band diagrams of the examined layers.

TL;DR: In this paper, the surface morphology of vacuum deposited copper phthalocyanine (CuPc) thin films surface was studied using the contact mode Atomic Force Microscope (AFM) and the influence of substrate temperature during deposition and of post-deposition UHV annealing on surface roughness as well as on the average and maximum grain height was determined.

TL;DR: In this article, the electronic properties of the space charge layer of the copper phthalocyanine (CuPc) thin films in situ prepared by an UHV evaporation method and, subsequently, exposed to molecular oxygen (O 2 ) and molecular hydrogen (H 2 ) have been studied using the high resolution photoemission yield spectroscopy (PYS) technique.

TL;DR: In this article, the authors examined the interface formation between deposited copper phthalocyanine (CuPc) thin films and covered with native oxide n- and p-type silicon Si(1.1) substrates.

TL;DR: In this paper, the influence of 12-hour exposure to the ambient air on the chemical and electronic properties of thin 16-nm copper phthalocyanine (CuPc) sensing layers deposited on n- and p-type silicon Si(111) substrates covered with the native oxide was investigated.