M
M. Barthula
Researcher at University of Paris-Sud
Publications - 6
Citations - 173
M. Barthula is an academic researcher from University of Paris-Sud. The author has contributed to research in topics: Schottky barrier & Annealing (metallurgy). The author has an hindex of 4, co-authored 6 publications receiving 171 citations.
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Journal ArticleDOI
Barrier inhomogeneities and electrical characteristics of Ti/4H-SiC Schottky rectifiers
D. Defives,Olivier Noblanc,Christian Dua,Christian Brylinski,M. Barthula,V. Aubry-Fortuna,F. Meyer +6 more
TL;DR: In this article, a model based on two parallel Schottky rectifiers with different barrier heights is presented, and it is shown that the excess current at low voltage can be explained by a lowering of the Schotty barrier in localized regions.
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Thermal stability and electrical properties of Zr/Si1−x−yGexCy contacts after rapid thermal annealing
TL;DR: In this article, the reaction between Zr and SiGeC alloys has been investigated by x-ray diffraction and Rutherford backscattering spectrometry, and the analysis indicated that the C49-Zr(Si1−xGex)2 is the final phase of the reaction.
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Contacts on Si1−x−yGexCy alloys: Electrical properties and thermal stability
V. Aubry-Fortuna,M. Barthula,J.-L. Perrossier,F. Meyer,V. Demuth,Horst P. Strunk,O. Chaix-Pluchery +6 more
TL;DR: In this article, the authors investigated the reactions between Zr and SiGeC alloys using rapid thermal annealing and showed that Zr may be a good candidate for contacts on IV-IV alloys in terms of thermal stability.
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Fermi level position at metal Si1−x−yGexCy interfaces
TL;DR: In this article, the Schottky barrier heights on n-and p-type Si1−x−yGexCy alloys with Zr, Ti, W, Ni and Pt as metals (ΦBn and ΦBp, respectively).
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Characterizations of Zr/Si1-x-yGexCy After Rapid Thermal Annealing
V. Aubry-Fortuna,M. Barthula,F. Meyer,A. Eyal,C. Cytermann,Moshe Eizenberg,O. Chaix-Pluchery +6 more
TL;DR: In this paper, the reaction between Zr and SiGeC alloys after Rapid Thermal anneals performed at 800°C for 5 min was investigated by X-Ray diffraction.