M
Magnus Odén
Researcher at Linköping University
Publications - 254
Citations - 8630
Magnus Odén is an academic researcher from Linköping University. The author has contributed to research in topics: Thin film & Microstructure. The author has an hindex of 50, co-authored 241 publications receiving 7486 citations. Previous affiliations of Magnus Odén include Los Alamos National Laboratory & Luleå University of Technology.
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Mechanical properties and machining performance of Ti1−xAlxN-coated cutting tools
TL;DR: In this paper, the mechanical properties and machining performance of Ti 1− x Al x N-coated cutting tools have been investigated, and it is shown that the Al content promotes a (200) preferred crystallographic orientation and has a large influence on the hardness of as-deposited coatings.
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Thermal stability of arc evaporated high aluminum-content Ti1−xAlxN thin films
TL;DR: In this paper, the thermal stability of Ti1−xAlxN films deposited by arc evaporation from Ti-Al cathodes with 67 and 75% aluminum, respectively, has been investigated.
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Nanoindentation studies of single‐crystal (001)‐, (011)‐, and (111)‐oriented TiN layers on MgO
TL;DR: In this paper, the mechanical properties of (001), (011) and (111) oriented MgO wafers and 1μm-thick TiN overlayers, grown simultaneously by dc magnetron sputter deposition at 700 °C in a mixed N2 and Ar discharge, were investigated using nanoindentation.
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Evolution of the residual stress state in a duplex stainless steel during loading
TL;DR: In this article, the evolution of micro-and macrostresses in a duplex stainless steel during loading has been investigated in situ by X-ray diffraction on a 1.5 mm cold-rolled sheet of alloy SAF 2304 solution treated at 1050°C.
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Nanostructure formation during deposition of TiN SiNx nanomultilayer films by reactive dual magnetron sputtering
TL;DR: In this article, a multilayer thin films consisting of titanium nitride (TiN) and silicon nitride(SiNx) layers with compositional modulation periodicities between 3.7 and 101.7 nm have been grown on silicon wafers.