M
Michael J. Rooks
Researcher at IBM
Publications - 43
Citations - 3600
Michael J. Rooks is an academic researcher from IBM. The author has contributed to research in topics: Nanowire & Field-effect transistor. The author has an hindex of 16, co-authored 42 publications receiving 3472 citations.
Papers
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Journal ArticleDOI
Graphene nano-ribbon electronics
TL;DR: In this article, the electrical properties of nano-ribboned field effect transistor (FE transistor) devices were investigated as a function of ribbon width, and it was shown that the resistivity of a ribbon increases as its width decreases, indicating the impact of edge states.
Journal ArticleDOI
Ultra-compact, low RF power, 10 Gb/s silicon Mach-Zehnder modulator.
TL;DR: Silicon p(+)-i-n(+) diode Mach-Zehnder electrooptic modulators having an ultra-compact length of 100 to 200 mum are presented and exhibit high modulation efficiency.
Journal ArticleDOI
Ultra-high-density phase-change storage and memory.
TL;DR: This work shows erasable thermal phase-change recording at a storage density of 3.3 Tb inch−2, which is three orders of magnitude denser than that currently achievable with commercial optical storage technologies.
Journal ArticleDOI
Measurement of Carrier Mobility in Silicon Nanowires
Oki Gunawan,Lidija Sekaric,Amlan Majumdar,Michael J. Rooks,Joerg Appenzeller,Jeffrey W. Sleight,Supratik Guha,Wilfried Haensch +7 more
TL;DR: The first direct capacitance measurements of silicon nanowires (SiNWs) and the consequent determination of field carrier mobilities in undoped-channel SiNW field-effect transistors (FETs) at room temperature are reported.
Proceedings Article
Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm
Naoki Tega,Hiroshi Miki,Francois Pagette,David J. Frank,Asit Kumar Ray,Michael J. Rooks,Wilfried Haensch,Kazuyoshi Torii +7 more
TL;DR: In this paper, the statistical distribution of random telegraph noise (RTN) has been measured and characterized in scaled PDSOI FETs down to 20nm gate length.