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Michael J. Rooks

Researcher at IBM

Publications -  43
Citations -  3600

Michael J. Rooks is an academic researcher from IBM. The author has contributed to research in topics: Nanowire & Field-effect transistor. The author has an hindex of 16, co-authored 42 publications receiving 3472 citations.

Papers
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Journal ArticleDOI

Graphene nano-ribbon electronics

TL;DR: In this article, the electrical properties of nano-ribboned field effect transistor (FE transistor) devices were investigated as a function of ribbon width, and it was shown that the resistivity of a ribbon increases as its width decreases, indicating the impact of edge states.
Journal ArticleDOI

Ultra-compact, low RF power, 10 Gb/s silicon Mach-Zehnder modulator.

TL;DR: Silicon p(+)-i-n(+) diode Mach-Zehnder electrooptic modulators having an ultra-compact length of 100 to 200 mum are presented and exhibit high modulation efficiency.
Journal ArticleDOI

Ultra-high-density phase-change storage and memory.

TL;DR: This work shows erasable thermal phase-change recording at a storage density of 3.3 Tb inch−2, which is three orders of magnitude denser than that currently achievable with commercial optical storage technologies.
Journal ArticleDOI

Measurement of Carrier Mobility in Silicon Nanowires

TL;DR: The first direct capacitance measurements of silicon nanowires (SiNWs) and the consequent determination of field carrier mobilities in undoped-channel SiNW field-effect transistors (FETs) at room temperature are reported.
Proceedings Article

Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm

TL;DR: In this paper, the statistical distribution of random telegraph noise (RTN) has been measured and characterized in scaled PDSOI FETs down to 20nm gate length.