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Mo Huang

Researcher at University of Macau

Publications -  77
Citations -  1064

Mo Huang is an academic researcher from University of Macau. The author has contributed to research in topics: Low-dropout regulator & Capacitor. The author has an hindex of 13, co-authored 67 publications receiving 601 citations. Previous affiliations of Mo Huang include Carnegie Mellon University & Sun Yat-sen University.

Papers
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Journal ArticleDOI

A Fully Integrated Digital LDO With Coarse–Fine-Tuning and Burst-Mode Operation

TL;DR: A coarse-fine-tuning technique with burst-mode operation is proposed to the digital low dropout regulator, which regulates the D-LDO to the desired output voltage and takes over the steady-state operation for high accuracy and current efficiency.
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A Wide Input Range Dual-Path CMOS Rectifier for RF Energy Harvesting

TL;DR: A dual-path CMOS rectifier with adaptive control for ultrahigh-frequency (UHF) RF energy harvesters and can be maintained above 20% with an 11-dB input range from −16 to −5 dBm, while only an 8- dB input range can be achieved with traditional single-path rectifiers.
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An Analog-Assisted Tri-Loop Digital Low-Dropout Regulator

TL;DR: This paper presents an analog-assisted (AA) output-capacitor-free digital low-dropout (D-LDO) regulator with tri-loop control, and a nonlinear coarse word control is designed for the carry-in/out operations.
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A Reconfigurable Bidirectional Wireless Power Transceiver for Battery-to-Battery Wireless Charging

TL;DR: A monolithic reconfigurable bidirectional WPT transceiver designed for the first time in CMOS, which can be reconfigured between a differential class-D power amplifier and a full-wave rectifier, and reduced the number of cascaded WPT stages from five in the conventional design to three.
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Limit Cycle Oscillation Reduction for Digital Low Dropout Regulators

TL;DR: An LCO reduction technique for the D-LDO is proposed, by adding two unit power transistors in parallel with the main power MOS array as a feedforward path and minimizes LCO with negligible circuit complexity and design difficulty.