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Moinuddin K. Qureshi

Researcher at Georgia Institute of Technology

Publications -  144
Citations -  11625

Moinuddin K. Qureshi is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Cache & Computer science. The author has an hindex of 44, co-authored 131 publications receiving 9956 citations. Previous affiliations of Moinuddin K. Qureshi include IBM & University of Texas at Austin.

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Proceedings ArticleDOI

Line Distillation: Increasing Cache Capacity by Filtering Unused Words in Cache Lines

TL;DR: This work proposes line distillation (LDIS), a technique that retains only the used words and evicts the unused words in a cache line, and proposes distill cache, a cache organization to utilize the capacity created by LDIS.

Utility-Based Cache Partitioning

TL;DR: In this article, the authors propose a low-overhead, runtime mechanism that partitions a shared cache between multiple applications depending on the reduction in cache misses that each application is likely to obtain for a given amount of cache resources.
Proceedings ArticleDOI

Morphable counters: enabling compact integrity trees for low-overhead secure memories

TL;DR: This paper proposes a scalable solution to this problem by proposing a compact integrity tree design that requires fewer memory accesses for its traversal, and enables this by proposing new storage-efficient representations for the counters used for encryption and integrity-tree in secure memories.
Proceedings ArticleDOI

FlashGuard: Leveraging Intrinsic Flash Properties to Defend Against Encryption Ransomware

TL;DR: FlashGuard is proposed, a ransomware tolerant Solid State Drive (SSD) which has a firmware-level recovery system that allows quick and effective recovery from encryption ransomware without relying on explicit backups and has a negligible impact on the performance and lifetime of the SSD.
Proceedings ArticleDOI

SYNERGY: Rethinking Secure-Memory Design for Error-Correcting Memories

TL;DR: This paper proposes Synergy, a reliability-security co-design that improves performance of secure execution while providing strong reliability for systems with 9-chip ECC-DIMMs and increases reliability by 185x compared to ECCs that provide Single-Error Correction, Double-Error Detection (SECDED) capability.