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Oliver Bunk

Researcher at Paul Scherrer Institute

Publications -  228
Citations -  17320

Oliver Bunk is an academic researcher from Paul Scherrer Institute. The author has contributed to research in topics: Scattering & Tomography. The author has an hindex of 61, co-authored 224 publications receiving 15755 citations. Previous affiliations of Oliver Bunk include University of Hamburg & University of Maryland, College Park.

Papers
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Journal ArticleDOI

Size-Dependent Shape Evolution of Patterned Polymer Films Studied in Situ by Phase-Retrieval-Based Small-Angle X-ray Scattering

Kim Nygård, +7 more
- 29 Jun 2012 - 
TL;DR: In this paper, small-angle X-ray scattering was employed to address the size-dependent shape evolution of poly(methyl methacrylate) (PMMA) gratings obtained by thermal nanoimprint lithography.
Proceedings ArticleDOI

Phase-contrast imaging and tomography at 60 keV using a conventional x-ray tube

Tilman Donath, +10 more
- 16 Sep 2008 - 
TL;DR: In this paper, a grating interferometer for phase-contrast imaging that operates at 60 keV x-ray energy has been developed, and the first phase contrast projection and CT images were recorded with this interferer using an xray tube source operated at 100 kV acceleration voltage.
Journal ArticleDOI

Atomic structure of the indium-induced Ge(001)(n×4) surface reconstruction determined by scanning tunneling microscopy and ab initio calculations

Gerald Falkenberg, +4 more
- 08 Jul 2002 - 
TL;DR: In this article, the atomic geometry of the superstructures formed by the adsorption of up to 0.5 monolayer of indium on Ge(001) and annealing at temperatures above 200 °C was determined using canning-tunneling microscopy (STM) and first-principles total energy calculations.
Journal ArticleDOI

Anisotropy in polyetheretherketone films

Jasmin Althaus, +5 more
- 01 Jan 2012 - 
TL;DR: In this article, linear dichroism measurements were correlated with synchrotron radiation-based x-ray scattering data on commercially available polyetheretherketone (PEEK) thin films (12 to 50 μm).
Journal ArticleDOI

Automated Analysis of Spatially Resolved X-ray Scattering and Micro Computed Tomography of Artificial and Natural Enamel Carious Lesions

Hans Deyhle, +6 more
- 15 Jun 2018 - 
TL;DR: The clear identification of the affected regions and the characterization of their nanostructure allow the artificially induced lesions to be verified against selected natural carious lesions, offering the potential to optimize artificial demineralization protocols.