O
Olivier Renault
Researcher at University of Grenoble
Publications - 100
Citations - 1516
Olivier Renault is an academic researcher from University of Grenoble. The author has contributed to research in topics: X-ray photoelectron spectroscopy & Silicon. The author has an hindex of 20, co-authored 90 publications receiving 1204 citations. Previous affiliations of Olivier Renault include French Alternative Energies and Atomic Energy Commission & Alternatives.
Papers
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Internal Structure of InP/ZnS Nanocrystals Unraveled by High-Resolution Soft X-ray Photoelectron Spectroscopy
TL;DR: The existence of In-S and S(x)-In-P(1-x) bonding states in both types of InP/ZnS nanocrystals are demonstrated, which allows a refined view on the underlying reaction mechanisms.
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Interface properties of ultra-thin HfO2 films grown by atomic layer deposition on SiO2/Si
TL;DR: In this paper, angle-resolved X-ray photoelectron spectroscopy (ARXPS), high-resolution transmission electron microscopy (HRTEM) and depth profiling techniques such as secondary ion mass spectrometry (SIMS) and Auger electron spectrography (AES) were used to characterize HfO2/SiO2 interfaces.
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Work‐function imaging of oriented copper grains by photoemission
TL;DR: This paper measured the work function of micrograins at the surface of a polycrystalline copper sample using NanoESCA, a photoelectron microscope equipped with two analysers in series.
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Large-grain MBE-grown GaSe on GaAs with a Mexican hat-like valence band dispersion
Mingwei Chen,HoKwon Kim,Dmitry Ovchinnikov,Agnieszka Kuc,Thomas Heine,Olivier Renault,Andras Kis +6 more
TL;DR: In this paper, the full valence band structure of nominal bilayer GaSe is revealed by photo-emission electron momentum microscopy (k-PEEM), confirming the presence of a distorted valence bands near the Γ point.
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Direct quantification of gold along a single Si nanowire.
Aude Bailly,Olivier Renault,Nick Barrett,Luiz Fernando Zagonel,Pascal Gentile,Nicolas Pauc,F. Dhalluin,Thierry Baron,Amal Chabli,J. C. Cezar,N. B. Brookes +10 more
TL;DR: The presence of gold on the sidewall of a tapered, single silicon nanowire is directly quantified from core-level nanospectra using energy-filtered photoelectron emission microscopy and characteristic local work functions are extracted using a model of the full secondary electron distributions.