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Patrick Gallagher

Researcher at Cadence Design Systems

Publications -  24
Citations -  422

Patrick Gallagher is an academic researcher from Cadence Design Systems. The author has contributed to research in topics: Automatic test pattern generation & Cache pollution. The author has an hindex of 11, co-authored 24 publications receiving 419 citations. Previous affiliations of Patrick Gallagher include IBM.

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Patent

Shared two level cache including apparatus for maintaining storage consistency

TL;DR: In this paper, a multilevel cache buffer for a multiprocessor system is described, where each processor has a level one cache storage unit which interfaces with a level two cache unit and main storage unit shared by all processors.
Patent

Method and mechanism for implementing electronic designs having power information specifications background

TL;DR: In this article, a method of adding power control circuitry to a circuit design at each RTL and a netlist level comprising demarcating multiple power domains within the circuit design, specifying multiple power modes each power mode corresponding to a different combination of on/off states of the multiple demarcated power domains, and defining isolation behavior relative to respective power domains is presented.
Patent

Hierarchical computer cache system

TL;DR: In this paper, a page mover is coupled to the higher level cache subsystem and main memory, and responds to a request from one of the CPUs to store data into the main memory.
Proceedings ArticleDOI

Capture power reduction using clock gating aware test generation

TL;DR: By taking advantage of the existing clock gating circuitry and selectively holding the value of some scan flip-flops, switching activity during the capture cycles of a test can be reduced.
Proceedings ArticleDOI

A Power-Aware Test Methodology for Multi-Supply Multi-Voltage Designs

TL;DR: A novel solution to address the manufacturing test of an MSMV/PSO design is described by using power-mode specifications to map multiple power modes to their target test modes and enhancing the DFT and ATPG methodology to enable a comprehensive test methodology.