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Peter L. Henriksen

Researcher at Technical University of Denmark

Publications -  15
Citations -  100

Peter L. Henriksen is an academic researcher from Technical University of Denmark. The author has contributed to research in topics: Thin film & Coating. The author has an hindex of 5, co-authored 14 publications receiving 60 citations.

Papers
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Proceedings ArticleDOI

Installation and commissioning of the silicon pore optics coating facility for the ATHENA mission

TL;DR: In this paper, an industrial scale coating facility for the Advanced Telescope for High-ENergy Astrophysics (ATHENA) mission has been successfully commissioned and tested, completing an important milestone in preparation of the Silicon Pore Optics (SPO) production capability.
Proceedings ArticleDOI

Performance and time stability of Ir/SiC X-ray mirror coatings for ATHENA

TL;DR: In this paper, the authors report the latest development of Ir/SiC bilayer bilayer coatings optimized for ATHENA and the characterization of coating performance and stability, motivated by the need for a compatible top layer material to improve the telescope performance at low energies.
Proceedings ArticleDOI

The effect of deposition process parameters on thin film coatings for the Athena X-ray optics

TL;DR: In this article, a literature study of the coating process parameter space and an overview of the thin film properties with a focus on micro roughness, chemical composition and wear resistance when deposited under various process conditions is presented.
Journal ArticleDOI

Investigation of boron carbide and iridium thin films, an enabling technology for future x-ray telescopes

TL;DR: An experimental examination of iridium and boron carbide thin-film coatings for the purpose of fabricating x-ray optics shows a correlation between the absorption edges and the emission lines exhibited by the thin films in an energy range from 50-800 eV and the impact on the reflectivity performance due to contamination in thin films.
Proceedings ArticleDOI

Compatibility of iridium thin films with the silicon pore optics technology for Athena

TL;DR: In this paper, the authors present X-ray reflectometry characterization of iridium thin films deposited on photoresist patterned silicon pore Optics plates to investigate the compatibility with the stacking process steps for the manufacturing of the Athena optics.