P
Peter L. Henriksen
Researcher at Technical University of Denmark
Publications - 15
Citations - 100
Peter L. Henriksen is an academic researcher from Technical University of Denmark. The author has contributed to research in topics: Thin film & Coating. The author has an hindex of 5, co-authored 14 publications receiving 60 citations.
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Proceedings ArticleDOI
Installation and commissioning of the silicon pore optics coating facility for the ATHENA mission
Sonny Massahi,Finn Erland Christensen,Desiree Della Monica Ferreira,Atefeh Jafari,Sara Svendsen,Peter L. Henriksen,Brian Shortt,Ivo Ferreira,Marcos Bavdaz,M. Collon,Boris Landgraf,David Girou,A. Langer,W. Schönberger,T. Wellner,Michael Krumrey,L. Cibik +16 more
TL;DR: In this paper, an industrial scale coating facility for the Advanced Telescope for High-ENergy Astrophysics (ATHENA) mission has been successfully commissioned and tested, completing an important milestone in preparation of the Silicon Pore Optics (SPO) production capability.
Proceedings ArticleDOI
Performance and time stability of Ir/SiC X-ray mirror coatings for ATHENA
Sara Svendsen,Sonny Massahi,Desiree Della Monica Ferreira,Finn Erland Christensen,Atefeh Jafari,Peter L. Henriksen,M. Collon,Boris Landgraf,David Girou,Michael Krumrey,L. Cibik,Anja Schubert,Eveline Handick,Brian Shortt +13 more
TL;DR: In this paper, the authors report the latest development of Ir/SiC bilayer bilayer coatings optimized for ATHENA and the characterization of coating performance and stability, motivated by the need for a compatible top layer material to improve the telescope performance at low energies.
Proceedings ArticleDOI
The effect of deposition process parameters on thin film coatings for the Athena X-ray optics
Sonny Massahi,Desiree Della Monica Ferreira,Finn Erland Christensen,Nis C. Gellert,Sara Svendsen,Peter L. Henriksen,A. S. Jegers,Maximilien J. Collon,Boris Landgraf,David Girou,Aniket Thete,Brian Shortt,Ivo Ferreira,Marcos Bavdaz,Waldemar Schönberger,Axel Langer +15 more
TL;DR: In this article, a literature study of the coating process parameter space and an overview of the thin film properties with a focus on micro roughness, chemical composition and wear resistance when deposited under various process conditions is presented.
Journal ArticleDOI
Investigation of boron carbide and iridium thin films, an enabling technology for future x-ray telescopes
Sonny Massahi,Finn Erland Christensen,Desiree Della Monica Ferreira,Sara Svendsen,Peter L. Henriksen,Lan M. Vu,Nis C. Gellert,A. S. Jegers,Brian Shortt,Marcos Bavdaz,Ivo Ferreira,M. Collon,Boris Landgraf,David Girou,Andrey Sokolov,W Schoenberger +15 more
TL;DR: An experimental examination of iridium and boron carbide thin-film coatings for the purpose of fabricating x-ray optics shows a correlation between the absorption edges and the emission lines exhibited by the thin films in an energy range from 50-800 eV and the impact on the reflectivity performance due to contamination in thin films.
Proceedings ArticleDOI
Compatibility of iridium thin films with the silicon pore optics technology for Athena
Sara Svendsen,Desiree Della Monica Ferreira,Sonny Massahi,Peter L. Henriksen,Nis C. Gellert,Arne S. Jegers,Finn Erland Christensen,Boris Landgraf,Aniket Thete,Maximilien J. Collon,Ivo Ferreira,Brian Shortt,Marcos Bavdaz +12 more
TL;DR: In this paper, the authors present X-ray reflectometry characterization of iridium thin films deposited on photoresist patterned silicon pore Optics plates to investigate the compatibility with the stacking process steps for the manufacturing of the Athena optics.