P
Peter Wobrauschek
Researcher at Vienna University of Technology
Publications - 151
Citations - 3462
Peter Wobrauschek is an academic researcher from Vienna University of Technology. The author has contributed to research in topics: X-ray fluorescence & Total internal reflection. The author has an hindex of 30, co-authored 151 publications receiving 3152 citations.
Papers
More filters
Journal ArticleDOI
Laser technology: source of coherent kiloelectronvolt X-rays.
Jozsef Seres,E. Seres,E. Seres,Aart J. Verhoef,Gabriel Tempea,Christina Streli,Peter Wobrauschek,Vladislav S. Yakovlev,Armin Scrinzi,Christian Spielmann,Ferenc Krausz +10 more
TL;DR: This work describes the emission of highly collimated, spatially coherent X-rays, at a wavelength of about 1 nanometre and at photon energies extending to 1.3 kiloelectronvolts, from atoms that have been ionized by a 5-femtosecond laser pulse.
Journal ArticleDOI
Coherent superposition of laser-driven soft-X-ray harmonics from successive sources
Jozsef Seres,Jozsef Seres,Vladislav S. Yakovlev,E. Seres,E. Seres,C. Streli,Peter Wobrauschek,Ch. Spielmann,Ferenc Krausz +8 more
TL;DR: In this article, coherent superposition of laser-driven soft-X-ray (SXR) harmonics, at wavelengths of 2-5nm, generated in two successive sources by one and the same laser pulse is reported.
Journal ArticleDOI
Total reflection x‐ray fluorescence analysis—a review
TL;DR: Total reflection x-ray fluorescence analysis (TXRF) is a special energy-dispersive X-ray analytical technique extending XRF down to the ultra trace element range as mentioned in this paper.
Journal ArticleDOI
Spatial distribution of the trace elements zinc, strontium and lead in human bone tissue
B. Pemmer,Andreas Roschger,A. Wastl,Jochen G. Hofstaetter,Peter Wobrauschek,Rolf Simon,Heinrich W. Thaler,Paul Roschger,Klaus Klaushofer,Christina Streli +9 more
TL;DR: It is shown for the first time that there is a differential accumulation of the trace elements Zn, Pb and Sr in BSUs of human bone indicating different mechanisms of accumulation.
Journal ArticleDOI
A method for quantitative X-ray fluorescence analysis in the nanogram region
TL;DR: In this paper, the application of X-ray total reflexion is used to reduce the background and to improve the ratio between signal and background so that measurements in the nanogram region can be made.