R
R. Kling
Researcher at University of Ulm
Publications - 23
Citations - 1101
R. Kling is an academic researcher from University of Ulm. The author has contributed to research in topics: Photoluminescence & Metalorganic vapour phase epitaxy. The author has an hindex of 13, co-authored 23 publications receiving 1074 citations.
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ZnMgO epilayers and ZnO–ZnMgO quantum wells for optoelectronic applications in the blue and UV spectral region
TL;DR: In this paper, the properties of ZnMgO epilayers and ZnO-ZnmgO quantum well structures grown by metalorganic vapor phase epitaxy were investigated.
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Optical and structural analysis of ZnCdO layers grown by metalorganic vapor-phase epitaxy
Th. Gruber,C. Kirchner,R. Kling,F. Reuss,Andreas Waag,Frank Bertram,D. Forster,Jürgen Christen,Matthias Schreck +8 more
TL;DR: In this article, structural and optical properties of Zn1−xCdxO layers grown by metalorganic vapor phase epitaxy were analyzed, and a narrowing of the fundamental band gap of up to 300 meV was observed.
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Optical investigations on the annealing behavior of gallium- and nitrogen-implanted ZnO
F. Reuss,C. Kirchner,Th. Gruber,R. Kling,S. Maschek,Wolfgang Limmer,Andreas Waag,Paul J. Ziemann +7 more
TL;DR: In this article, a series of nitrogen-implanted ZnO samples were analyzed by means of Raman scattering and low-temperature photoluminescence, and the binding energy of the nitrogen acceptor was estimated to be between 163 and 196 meV.
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Pressure-dependent photoluminescence study of ZnO nanowires
W. Shan,Wladek Walukiewicz,Joel W. Ager,Kin Man Yu,Yong-Hang Zhang,S. S. Mao,R. Kling,C. Kirchner,Andreas Waag +8 more
TL;DR: In this paper, pressure dependence of the photoluminescence (PL) transition associated with the fundamental band gap of ZnO nanowires has been studied at pressures up to 15 GPa.
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Influences of biaxial strains on the vibrational and exciton energies in ZnO
TL;DR: In this paper, the structural, optical, and vibrational properties of strained heteroepitaxial ZnO layers were investigated by high resolution x-ray diffraction, reflectivity, and Raman measurements.