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Reuben M. Bakker

Researcher at Agency for Science, Technology and Research

Publications -  27
Citations -  4679

Reuben M. Bakker is an academic researcher from Agency for Science, Technology and Research. The author has contributed to research in topics: Near-field scanning optical microscope & Plasmon. The author has an hindex of 14, co-authored 27 publications receiving 4068 citations. Previous affiliations of Reuben M. Bakker include Purdue University & Data Storage Institute.

Papers
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Demonstration of a spaser-based nanolaser

TL;DR: It is shown that 44-nm-diameter nanoparticles with a gold core and dye-doped silica shell allow us to completely overcome the loss of localized surface plasmons by gain and realize a spaser, and that outcoupling of surface plasmon oscillations to photonic modes at a wavelength of 531 nm makes this system the smallest nanolaser reported to date—and to the authors' knowledge the first operating at visible wavelengths.
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Nonradiating anapole modes in dielectric nanoparticles

TL;DR: It is demonstrated experimentally that dielectric nanoparticles can exhibit a radiationless anapole mode in visible, and the spectral overlap of the toroidal and electric dipole modes is achieved through a geometry tuning.
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Magnetic and Electric Hotspots with Silicon Nanodimers

TL;DR: For the first time, hotspots of the magnetic field at visible wavelengths for light polarized across the nanodimer's primary axis are observed using near-field scanning optical microscopy.
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Directional lasing in resonant semiconductor nanoantenna arrays

TL;DR: In this paper, the authors demonstrate directional lasing, with a low threshold and high quality factor, in active dielectric nanoantenna arrays achieved through a leaky resonance excited in coupled gallium arsenide (GaAs) nanopillars.
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A Metalens with a Near-Unity Numerical Aperture

TL;DR: This work, based on diffractive elements that can efficiently bend light at angles as large as 82°, represents a step beyond traditional optical elements and existing flat optics, circumventing the efficiency drop associated with the standard, phase mapping approach.